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Displaying 1-1 of 1 results for author "Schnabel, C. M."
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / C.M. Schnabel [and six others].
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, February 2000.
- 2000-2
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo85917
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