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Displaying 1-3 of 3 results for author "Siegel, Benjamin M."
Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 75-1300 Offsite Modern developments in electron microscopy.
- Text
- New York, Academic Press, 1964.
- 1964
- 1 Item
Item details Format Call Number Item Location Text OCC (Siegel, B. M. Modern developments in electron microscopy) Offsite Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4S53 1975 Off-site
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