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Displaying 1-1 of 1 results for author "Symposium on X-Ray and Electron Probe Analysis (1963 : Atlantic City)"
Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
- Text
- Philadelphia, American Society for Testing and Materials [1964]
- 1964
- 1 Item
Item details Format Call Number Item Location Text VEE (American Society for Testing Materials. Special technical publication. no. 349) Offsite
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