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Displaying 1-1 of 1 results for author "Tran, Huy Kim."
Thermal degradation study of silicon carbide threads developed for advanced flexible thermal protection systems [microform] / Huy Kim Tran and Paul M. Sawko.
- Text
- Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
- 1992
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