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Forces in scanning probe methods / edited by H.-J. Güntherodt, D. Anselmetti and E. Meyer.
- Text
- Dordrecht ; Boston : Kluwer Academic in cooperation with NATO Scientific Affairs Division, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSE 95-1000 Offsite Not available - Please for assistance.Atomic force microscopy/scanning tunneling microscopy / edited by Samuel H. Cohen, Mona T. Bray, and Marcia L. Lightbody.
- Text
- New York : Plenum Press, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text JSF 95-590 Offsite Not available - Please for assistance.Simulation of tip-sample interaction in the atomic force microscope [microform] / Brian S. Good and Amitava Banerjea.
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
- 1994
Surface diagnostics in tribology technology and advanced coatings development [microform] / Kazuhisa Miyoshi.
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
- 1999
STM and AFM studies on (bio)molecular systems : unravelling the nanoworld / volume editor, Paolo Samorí ; with contributions by F. Cicoira ... [et al.].
- Text
- Berlin : Springer, c2008.
- 2008
- 1 Item
Item details Format Call Number Item Location Text JSE 08-584 Offsite Not available - Please for assistance.Single molecule study of cellulase hydrolysis of crystalline cellulose : preprint / Y.-S. Liu ... [and others].
- Text
- Golden, CO : National Renewable Energy Laboratory, [2009]
- 2009
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/LPS120450Method for measuring the diameter of polystyrene latex reference spheres by atomic force microscopy / John A. Dagata; Natalia Farkas; Prem Kavuri; Andras E. Vladar; Chung-Lin Wu; Hiroshi Itoh; Kensei Ehara.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
- 2016
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo104484Reliability implications of solder in multiwire modules under dynamic mechanical loading : preprint / Laura Spinella [and five others].
- Text
- Golden, CO : National Renewable Energy Laboratory, 2021.
- 2021
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo172105Atomic force microscopy [electronic resource] / Peter Eaton, Paul West.
- Text
- Oxford ; New York : Oxford University Press, 2010.
- 2010
- 1 Resource
Available Online
http://WU9FB9WH4A.search.serialssolutions.com/?V=1.0&L=WU9FB9WH4A&S=JCs&C=TC0000409783&T=marc&tab=BOOKSAtomic force microscopy/scanning tunneling microscopy / edited by Samuel H. Cohen, Mona T. Bray, and Marcia L. Lightbody.
- Text
- New York : Plenum Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text QH212.A78 A86 1994 Off-site Not available - Please for assistance.Forces in scanning probe methods / edited by H.-J. Güntherodt, D. Anselmetti and E. Meyer.
- Text
- Dordrecht ; London : Kluwer Academic in cooperation with NATO Scientific Affairs Division, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 N372 1994g Off-site Not available - Please for assistance.Atomic force microscopy/scanning tunneling microscopy 2 / edited by Samuel H. Cohen and Marcia L. Lightbody.
- Text
- New York : Plenum Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text QH212.A78 A863 1997 Off-site Not available - Please for assistance.Atomic force microscopy : biomedical methods and applications / edited by Pier Carlo Braga, Davide Ricci.
- Text
- 2004
- 1 Item
Item details Format Call Number Item Location Text QH506 .M56 v.242 Off-site Not available - Please for assistance.Atomic force microscopy in adhesion studies / edited by Jaroslaw Drelich and Kash L. Mittal.
- Text
- Leiden ; Boston : VSP, 2005.
- 2005
- 1 Item
Item details Format Call Number Item Location Text QH212.A78 A84 2005g Off-site Not available - Please for assistance.Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp.
- Text
- Berlin ; New York : Springer-Verlag, 2006.
- 2006
- 1 Item
Item details Format Call Number Item Location Text QH212.A78 K38 2006g Off-site Not available - Please for assistance.Amplitude modulation atomic force microscopy / by Ricardo García.
- Text
- Weinheim : Wiley-VCH ; Chichester : John Wiley [distributor], 2010.
- 2010
- 1 Item
Item details Format Call Number Item Location Text QH212.A78 C37 2010g Off-site Not available - Please for assistance.Carbon nanotube tips as nanometer scale probes for chemistry and biology / a thesis presented by Stanislaus Sherwood Wong.
- Text
- 1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text THESIS Off-site Not available - Please for assistance.Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces / edited by W.J. Lorenz and W. Plieth.
- Text
- Weinheim ; New York : Wiley-VCH, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text T174.7 .E43 1998 Off-site Not available - Please for assistance.Molecular manipulation with atomic force microscopy / edited by Anne-Sophie Duwez, Nicolas Willet.
- Text
- Boca Raton, FL : CRC Press, c2012.
- 2012
- 1 Item
Item details Format Call Number Item Location Text T174.7 .M645 2012 Off-site Not available - Please for assistance.Atomic force microscopy in cell biology / edited by Bhanu P. Jena, J.K. Heinrich Hörber.
- Text
- San Diego : Academic Press, c2002.
- 2002
- 1 Item
Item details Format Call Number Item Location Text QH585 .M47 vol.68 Off-site Not available - Please for assistance.Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / [edited by] W. Richard Bowen and Nidal Hilal.
- Text
- Oxford ; Burlington, MA : Butterworth-Heinemann, 2009.
- 2009
- 1 Item
Item details Format Call Number Item Location Text QH212.A78 A86 2009 Off-site Not available - Please for assistance.Nanoscale processes on insulating surfaces / Enrico Gnecco, Marek Szymonski.
- Text
- Singapore ; Hackensack, NJ : World Scientific, c2009.
- 2009
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 G64 2009 Off-site Not available - Please for assistance.Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments / Hui Xie, Cagdas Onal, Stéphanie Régnier, and Metin Sitti.
- Text
- Berlin : Springer, c2011.
- 2011
- 1 Item
Item details Format Call Number Item Location Text TJ211.36 .X54 2011 Off-site Not available - Please for assistance.Atomic force microscopy : methods and protocols / edited by Nuno C. Santos and Filomena A. Carvalho.
- Text
- New York, NY : Humana Press, [2019]
- 2019-2019
- 1 Item
Item details Format Call Number Item Location Text QH506 .M45 1984 vol.1886 Off-site Not available - Please for assistance.
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