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Displaying 1-18 of 18 results
The measurement of intelligence [microform] ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, by Lewis M. Terman.
- Text
- Boston, New York [etc.] Houghton Mifflin Co. [c1916]
- 1916
- 1 Item
Item details Format Call Number Item Location Text *Z-6160 no. 1-5 Offsite Herring revision of the Binet-Simon Tests [microform] : examination manual: form A / by John P. Herring.
- Text
- Yonkers-on-Hudson, N.Y. : World book Company, 1926, c1922.
- 1926-1922
- 1 Item
Item details Format Call Number Item Location Text -*Z-6461 1-8 Offsite Herring revision of the Binet-Simon tests and verbal and abstract elements in intelligence examinations.
- Text
- New York, Teachers college, Columbia university, 1924.
- 1924
A brief Binet-Simon scale / by Edgar A. Doll.
- Text
- [S.l. : s.n., 1918]
- 1918
A revision of the Binet-Simon system for measuring the intelligence of children, by F. Kuhlmann.
- Text
- Faribault, Minnesota School for Feeble-minded and Colony for Epileptics [1912]
- 1912
- 1 Item
Item details Format Call Number Item Location Text WPA (Journal of psycho-asthenics. Monograph supplements) v. 1, no. 1-3 Offsite The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman.
- Text
- Boston : Houghton Mifflin Company, [1916], ©1916.
- 1916-1916
- 1 Item
Item details Format Call Number Item Location Text 150.72 T273 Off-site A handbook of mental tests : a further revision and extension of the Binet-Simon scale / by F. Kuhlmann.
- Text
- Baltimore : Warwick & York, Inc., 1932.
- 1932
- 1 Item
Item details Format Call Number Item Location Text 150.72 K951 Off-site Differential response of normal and feebleminded subjects of equal mental age, on the Kent-Rosanoff free association test and the Stanford revision of the Binet-Simon intelligence test / by John Holman McFadden.
- Text
- Baltimore, Md. : The Williams & Wilkins Co., [1931], [©1931]
- 1931-1931
- 1 Item
Item details Format Call Number Item Location Text 150.5 M52 no.7-10 Off-site Alfred Binet / [by] Theta H. Wolf.
- Text
- Chicago : University of Chicago Press, [1973]
- 1973
- 1 Item
Item details Format Call Number Item Location Text BF109.B5 W64 Off-site The development of intelligence in children / by Alfred Binet and Theodore Simon ; with marginal notes by Lewis M. Terman ; new preface ... by Lloyd M. Dunn.
- Text
- Nashville, Tenn. : Williams Printing Co., 1980.
- 1980-1916
- 1 Item
Item details Format Call Number Item Location Text LB1131 .B4 1980 Off-site The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman.
- Text
- Boston : Houghton Mifflin Company, c1916.
- 1916
- 1 Item
Item details Format Call Number Item Location Text LB1131 .T476 1916 Off-site Alfred Binet [by] Theta H. Wolf.
- Text
- Chicago, University of Chicago Press [1973]
- 1973
- 1 Item
Item details Format Call Number Item Location Text BF109.B5W64 Off-site Variable factors in the Binet tests / by Carl C. Brigham.
- Text
- Princeton : Princeton University Press, 1917.
- 1917
- 1 Item
Item details Format Call Number Item Location Text 6493 .211 Off-site A syllabus for the clinical examination of children; with the revised Binet-Simon scale for the measurement of intelligence, by Edmund B. Huey.
- Text
- Baltimore, Md., Warwich & York [c1912]
- 1912
- 1 Item
Item details Format Call Number Item Location Text LB1121.H87 1912 Off-site Standard method of testing juvenile mentality by the Binet-Simon scale and the Porteus scale of performance tests; a uniform procedure and analysis.
- Text
- Philadelphia, Lippincott, [c1920]
- 1920
- 1 Item
Item details Format Call Number Item Location Text 64941.631 Off-site The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, by Lewis M. Terman ...
- Text
- Boston, New York Houghton Mifflin Company [©1916]
- 1916
- 1 Item
Item details Format Call Number Item Location Text LB1131 .T476 1916 Off-site Variable factors in the Binet tests / by Carl C. Brigham.
- Text
- Princeton : Princeton University Press, 1917.
- 1917
- 1 Item
Item details Format Call Number Item Location Text 6493 .211 Off-site Standard method of testing juvenile mentality by the Binet-Simon scale, with the original questions, pictures, and drawings; a uniform procedure and analysis, by Norbert J. Melville ... With an introduction by William Healy.
- Text
- Philadelphia, London, J.B. Lippincott Company [©1917]
- 1917
- 1 Item
Item details Format Call Number Item Location Text 64941.631.11 Off-site
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