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  • Issues, concepts, and standard techniques in assessing accuracy of coordinate measuring machines [microform] / Dennis A. Swyt.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1993.
    • 1993

  • Thermal effects of handling ball bars / Jianying Shi, Ted Doiron, Bruce Borchardt.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1989.
    • 1989

  • A users' guide to NIST SRM 2084 [microform] : CMM probe performance standard / G.W. Caskey ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1994.
    • 1994

  • Laser trackers [microform] : traceability, uncertainty, and standardization : a report to the CMSC / G.W. Caskey, C.J. Fronczek, Jr., S.D. Phillips.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
    • 1997

  • Integrated vision and touch sensing for CMMs [microform] / Yoshimi, B. ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
    • 1997
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS703

  • NGIS SIM specification [microform] / William G. Rippey ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
    • 1998
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS2054

  • The NIST DMIS interpreter, version 2 [microform] / Thomas R. Kramer ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
    • 1998

  • Distributed testing of a device-level interface specification for a metrology system [microform] / John Horst ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
    • 2002

  • A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9 [microform] / T. Kramer, J. Horst.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, Intelligent Systems Division, National Institute of Standards and Technology, [2002]
    • 2002

  • Standardized performance testing metrics for optical coordinate measurement systems / S. D. Phillips.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
    • 2013
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo100444

  • Thermal effects of handling ball bars / Jianying. Shi.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1989.
    • 1989
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo96344

  • Issues, concepts, and standard techniques in assessing accuracy of coordinate measuring machines / Dennis A. Swyt.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1993.
    • 1993
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo103656

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