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  • High angular resolution stellar interferometry : the proceedings of Colloquium No. 50, International Astronomical Union, held at the University of Maryland, College Park, Maryland, U.S.A., 30 August-1 September, l978 / edited by John Davis and William, J. Tango.

    • Text
    • [Sydney] : Chatterton Astronomy Dept., School of Physics, University of Sydney, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 82-334Offsite

  • Interferometry / W.H. Steel.

    • Text
    • Cambridge [Cambridgeshire] ; New York : Cambridge University Press, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-173Offsite

  • Optical interferometry / P. Hariharan.

    • Text
    • Sydney ; Orlando : Academic Press, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-2218Offsite

  • Interferometry of fibrous materials / N. Barakat and A.A. Hamza.

    • Text
    • Bristol, England ; New York : A. Hilger, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-851Offsite

  • Basics of interferometry / P. Hariharan.

    • Text
    • Boston ; New York : Academic Press, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-2009Offsite

  • Very high angular resolution imaging : proceedings of the 158th Symposium of the International Astronomical Union, held at the Women's College, University of Sydney, Australia, 11-15 January 1993 / edited by J.G. Robertson and W.J. Tango.

    • Text
    • Dordrecht [The Netherlands] ; Boston : Kluwer Academic, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 94-589Offsite

  • Quantum optics VI : proceedings of the Sixth International Symposium on Quantum Optics, Rotorua, New Zealand, January 24-28, 1994 / D.F. Walls, J.D. Harvey, eds.

    • Text
    • Berlin ; New York : Springer-Verlag, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 95-259Offsite

  • Interferogram analysis : digital fringe pattern measurement techniques / edited by David W. Robinson and Graeme T. Reid.

    • Text
    • Bristol ; Philadelphia : Institute of Physics, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 94-1131Offsite

  • Astronomy with millimeter and submillimeter wave interferometry : IAU Colloquium 140, meeting held 5-9 October 1992, Hakone, Japan / edited by M. Ishiguro and Wm. J. Welch.

    • Text
    • San Francisco : Astronomical Society of the Pacific, 1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 95-882Offsite

  • Infrared space interferometry : astrophysics & the study of earth-like planets : proceedings of a Workshop held in Toledo, Spain, March 11-14, 1996 / edited by C. Eiroa ... [et al.].

    • Text
    • Dordrecht ; Boston : Kluwer Academic Pubishers, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 97-1082Offsite

  • High angular resolution in astrophysics / edited by Anne-Marie Lagrange and Denis Mourard, and Pierre Léna.

    • Text
    • Dordrecht ; Boston : Kluwer Academic, 1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 97-1527Offsite

  • Practical spectroscopy.

    • Text
    • [London] Hilger & Watts, 1949.
    • 1949
    • 1 Item
    FormatCall NumberItem Location
    Text PET (Candler, A. C. Practical spectroscopy) 1949Offsite

  • Interferometry; a symposium held at the National Physical Laboratory on 9th, 10th, 11th June 1959.

    • Text
    • London, H.M. Stationery Off., 1960.
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text PED (National Physical Laboratory, Teddington, Eng. Interferometry) 1960Offsite

  • Analytische interferometrie.

    • Text
    • Leipzig, Akademische Verlagsgesellschaft, 1967.
    • 1967
    • 1 Item
    FormatCall NumberItem Location
    Text PED (Nebe, W. Analytische interferometrie) 1967Offsite

  • An introduction to interferometry.

    • Text
    • London, New York, Longmans, Green [1955]
    • 1955
    • 1 Item
    FormatCall NumberItem Location
    Text PED (Tolansky, S. Introduction to interferometry) 1955Offsite

  • Microstructures of surfaces, using interferometry [by] S. Tolansky.

    • Text
    • New York, American Elsevier Pub. Co. [1968]
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Text PED (Tolansky, S. Microstructures of surfaces, using interferometry) 1968Offsite

  • Surface microtopography.

    • Text
    • New York, Interscience Publishers [1960]
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text PED (Tolansky, S. Surface microtopography) 1960Offsite

  • Interferogram analysis for optical testing / Daniel Malacara, Manuel Servín, Zacarias Malacara.

    • Text
    • New York : Marcel Dekker, c1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 98-1189Offsite

  • Optische Messungen des Chemikers und des Mediziners.

    • Text
    • Dresden, Steinkopff, 1925.
    • 1925
    • 1 Item
    FormatCall NumberItem Location
    Text PKR p.v. 68 no. 1-8Schwarzman Building - General Research Room 315
    Request for On-site UseRequest Scan

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Catching the perfect wave : adaptive optics and interferometry in the 21st century : proceedings of a symposium held as a part of the 110th Annual Meeting of the ASP, Albuquerque, New Mexico, USA, 28 June-1 July 1998 / edited by Sergio R. Restaino and William Junor and Nebojsa Duric.

    • Text
    • San Francisco, Calif. : Astronomical Society of the Pacific, 1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-134Offsite

  • Imaging at radio through submillimeter wavelengths : proceedings of a meeting held at Loews Ventana Canyon Resort, Tucson, Arizona, USA, 6-9 June 1999 / edited by Jeffrey G. Mangum and Simon J.E. Radford.

    • Text
    • San Francisco, Calif. : Astronomical Society of the Pacific, 2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 01-268Offsite

  • Tropospheric wind profiling using radar "Interferometry" : (a feasibility study of a compact mobile system) / Richard J. Lataitis, Steven F. Clifford, Peter T. May.

    • Text
    • Boulder, Colo. : Wave Propagation Laboratory, U.S. Dept. of Commerce, National Oceanic and Atmospheric Administration, Environmental Research Laboratories, ; Springfield, Va. : For sale by the National Technical Information Service, [1990]
    • 1990

  • An Interferometric spectral mapper for the Cassini Mission to Saturn and Titan [microform] : final report for NAGW-1801.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration, 1991]
    • 1991

  • GPS interferometry [microform] : semi-annual progress report, April 1 - September 30, 1992 / by Frank van Graas, principal investigator.

    • Text
    • Hampton, VA : NASA Langley Research Center, [1992]
    • 1992

  • Solid state laser systems for space application [microform] : NASA grant NAG5-1319 : fo[u]rth semi-annual report, Summer '93 / Richard B. Kay; principal investigator.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

  • Planetary system detection by points [microform] : grant NAGW-1355 : semiannual reports, 1, 2, and 3 and final report for the period 15 June 1988 through 31 March 1990 / principal investigator: Robert D. Raesenberg.

    • Text
    • Cambridge, Mass. : Smithsonian Institution Astrophysical Observatory ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

  • Interferometric tracking system for the tracking and data relay satellite [microform] : final report for NASA SBIR contract NAS 5-30313.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

  • Precision optical INTerferometry in space (POINTS) [microform] : final report to innovative research program.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1989]
    • 1989

  • Optical system analysis for the ground-based experimental vector magnetograph (EXVM) [microform] : final report / prepared by L.W. Hillman, R.A. Chipman, M.H. Smith.

    • Text
    • [Huntsville, Ala.] : Dept. of Physics, University of Alabama in Huntsville : NASA Marshall Space Flight Center, [1993]
    • 1993

  • Speckle interferometry applied to asteroids and other solar system objects [microform] : final report for NAGW-224 : August 1981 - July 1984 / John D. Drummond and E. Keith Hege.

    • Text
    • Tucson, Ariz. : Steward Observatory, University of Arizona ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1985]
    • 1985

  • Advanced tracking systems design and analysis [microform] / prepared for Goddard Space Flight Center by Computer Sciences Corporation.

    • Text
    • [Greenbelt, Md.] : Computer Sciences Corp. ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1989]
    • 1989

  • Defocus measurement using a liquid crystal point diffraction interferometer [microform] / Carolyn R. Mercer and Katherine Creath.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • Analysis of 7- x 10-foot high speed wind tunnel shaft loads in support of fan blade failure investigation [microform] / Richard W. Faison.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1987]
    • 1987

  • Interferometry theory for the Block II processor [microform] / J.B. Thomas.

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987

  • Liquid crystal point diffraction interferometer [microform] / Carolyn Regan Mercer.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • NASA/JPL Aircraft SAR Workshop proceedings [microform] : February 4-5, 1985, at the Jet Propulsion Laboratory, Pasadena, California / N. Donovan, D. Evans, D. Held, editors.

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1985]
    • 1985

  • Performance analysis of a GPS interferometric attitude determination system for a gravity gradient stabilized spacecraft [microform] / by John C. Stoll.

    • Text
    • Cambridge, Mass. : Charles Stark Draper Laboratory ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • Measuring long gage blocks with the NIST line scale interferometer [microform] / John S. Beers.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.
    • 1995

  • A Lunar Optical-Ultraviolet-Infrared Synthesis Array (LOUISA) [microform] : proceedings of a workshop sponsored by the National Aeronautics and Space Administration, and held at the University of New Mexico, Albuquerque, New Mexico, February 8-10, 1989 / edited by Jack O. Burns, Stewart W. Johnson, Nebojsa Duric.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1992.
    • 1992

  • Quantitative rainbow schlieren deflectometry [microform] / Paul S. Greenberg, Robert B. Klimek, and Donald R. Buchele.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995-1995

  • Robust quantitative measurement of flows and transparent or highly reflective objects [microform] / Carolyn R. Mercer and Nasser Rashidnia.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • High data density temperature measurement for quasi steady-state flows [microform] / C. R. Mercer, N. Rashidnia, K. Creath.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996

  • Observations of therospheric horizontal winds at Watson Lake, Yukon Territory (Lambda=65̊ N) [microform] / R.J. Niciejewski, T.L. Killeen [and] Stanley C. Solomon.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • Fiber-optic temperature sensor using a thin-film Fabry-Perot interferometer [microform] / Glenn Beheim ; submitted in partial fulfillment of the requirements for the degreee of Doctor of Philosophy.

    • Text
    • [Cleveland, Ohio] : Dept. of Electrical Engineering and Applied Physics, Case Western Reserve University ; [Washington, DC : National Aeronautics and Space Administration, Langley Research Center ; Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • Effect of refractive index variation on two-wavelength interferometry for fluid measurements [microform] / Carolyn R. Mercer.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, VA : National Technical Information Service, distributor, [1998]
    • 1998

  • Refraction and scattering interferometric errors in the lower atmosphere [microform] / J.H. Churnside, I.M. Fuks.

    • Text
    • Boulder, Colo. : U.S. Dept. of Commerce, National Oceanic and Atmospheric Administration, Environmental Research Laboratories, Environmental Technology Laboratory ; Springfield, VA : For sale by the National Technical Information Service, [1998]
    • 1998

  • Summaries of the sixth annual JPL Airborne Earth Science Workshop, March 4-8, 1996 [microform].

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996-1996

  • Generation of digital elevation models through spaceborne SAR interferometry / David Small.

    • Text
    • Zurich, Switzerland : Remote Sensing Laboratories, Dept. of Geography, University of Zurich, 1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 02-51Offsite

  • Demodulation system for fiber optic Bragg grating dynamic pressure sensing [microform] / John D. Lekki, Grigory Adamovsky, Bertram Floyd.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2001]
    • 2001
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS23305

  • Interferometric metrology of photomask blanks [microform] : approaches using 633 nm wavelength / C.J. Evans ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
    • 2000

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