Research Catalog

  • M.O.S.T. integrated circuit engineering. Edited by J. Mavor.

    • Text
    • Stevenage, Eng., Peter Peregrinus, 1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 74-409Offsite
    Not available - Please for assistance.
  • MOS field-effect transistors and integrated circuits.

    • Text
    • New York, Wiley [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 74-1059Offsite
    Not available - Please for assistance.
  • Oxide semiconductors, by Z. M. Jarzębski. Translated from the Polish by G. Grzybowska-Świerkosz. Translation edited by Brian Randall Pamplin.

    • Text
    • Oxford, New York, Pergamon Press [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 74-1119Offsite
    Not available - Please for assistance.
  • Manual for MOS users / John D. Lenk.

    • Text
    • Reston, Va. : Reston Pub. Co., [1975]
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-1140Offsite
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  • Understanding CMOS integrated circuits / by Roger Melen and Harry Garland. 1st ed.

    • Text
    • Indianapolis : H. W. Sams, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 75-1257Offsite
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  • MOSFET circuits guidebook, with 100 tested projects / by Rufus P. Turner. 1st ed.

    • Text
    • Blue Ridge Summit, Pa. : G/L Tab Books, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 76-568Offsite
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  • Colloque international sur propriétés et utilisation des structures M. I. S. International conference on properties and use of M. I. S. structures. Grenoble, 17-20 juin 1969. Édité par Joseph Borel.

    • Text
    • Grenoble, Centre d'études nucléaires de Grenoble [1969]
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-1386Offsite
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  • MOS and special-purpose bipolar integrated circuits and R-F power transistor circuit design / edited by Bryan Norris.

    • Text
    • New York : McGraw Hill, c1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 77-334Offsite
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  • MOSFET technologies, a comprehensive bibliography / compiled by A. H. Agajanian.

    • Text
    • New York : IFI/Plenum, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 81-525Offsite
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  • The physics of MOS insulators : proceedings of the International Topical Conference on the Physics of MOS Insulators, held at the Jane S. McKimmon Conference Center, North Carolina State University Raleigh, North Carolina, June 18-20, 1980 / editors, Gerald Lucovsky, Sokrates T. Pantelides, Frank L. Galeener.

    • Text
    • New York : Pergamon Press, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 81-619Offsite
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  • Instabilities in MOS devices / J. R. Davis.

    • Text
    • New York : Gordon & Breach Science Publishers, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 82-35Offsite
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  • MOS device and circuit design / Oliver J. McCarthy.

    • Text
    • Chichester ; New York : Wiley, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 82-951Offsite
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  • MOS (metal oxide semiconductor) physics and technology / E.H. Nicollian, J.R. Brews.

    • Text
    • New York : Wiley, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 82-710Offsite
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  • VLSI, basic MOS engineering / Charles M. Botchek.

    • Text
    • Saratoga, Calif. : Pacific Technical Group, c1983-
    • 1983-present
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 84-7 v. 1Offsite
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  • The MOS memory data for design engineers, 1980.

    • Text
    • [Houston, Tex.]: Texas Instruments, 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 81-1310Offsite
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  • MOS devices : design and manufacture / edited by A.D. Milne.

    • Text
    • New York : Wiley, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-217Offsite
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  • Analysis and design of analog integrated circuits / Paul R. Gray, Robert G. Meyer.

    • Text
    • New York : Wiley, c1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 85-704Offsite
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  • Modern MOS technology : processes, devices, and design / DeWitt G. Ong.

    • Text
    • New York : McGraw-Hill, c1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 85-1535Offsite
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  • Introduction to nMOS and CMOS VLSI systems design / Amar Mukherjee.

    • Text
    • Englewood Cliffs, N.J. : Prentice-Hall, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-2706Offsite
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  • Insulating films on semiconductors : proceedings of the international conference, INFOS 83, Eindhoven, the Netherlands, 11-13 April, 1983 / edited by J.F. Verweij and D.R. Wolters.

    • Text
    • Amsterdam ; New York : North-Holland ; New York : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-115Offsite
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  • Analog MOS integrated circuits for signal processing / Roubik Gregorian, Gabor C. Temes.

    • Text
    • New York : Wiley, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-107Offsite
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  • Advanced MOS devices / Dieter K. Schroder.

    • Text
    • Reading, Mass. : Addison-Wesley Pub. Co., c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-2515Offsite
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  • Ionizing radiation effects in MOS devices and circuits / edited by T.P. Ma and Paul V. Dressendorfer.

    • Text
    • New York : Wiley, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 89-1764Offsite
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  • Models for large integrated circuits / by Patrick Dewilde and Zhen-Qiu Ning.

    • Text
    • Boston : Kluwer Academic Publishers, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 90-2213Offsite
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  • CMOS/TTL digital systems design / James E. Buchanan ; drawings by Bert D. Buchanan.

    • Text
    • New York : McGraw-Hill, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 90-1757Offsite
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  • MOS switched-capacitor and continuous-time integrated circuits and systems : analysis and design / Rolf Unbehauen, Andrzej Cichocki.

    • Text
    • Berlin ; New York : Springer-Verlag, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-285Offsite
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  • Statistical modeling for computer-aided design of MOS VLSI circuits / by Christopher Michael, Mohammed Ismail.

    • Text
    • Boston : Kluwer Academic Publishers, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-757Offsite
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  • MOS ICs : from Basics to ASICS / H.J.M. Veendrick.

    • Text
    • Weinheim ; New York : VCH, 1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 93-702Offsite
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  • Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang.

    • Text
    • Boston : Kluwer Academic, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1838Offsite
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  • Simultaneous switching noise of CMOS devices and systems / by Ramesh Senthinathan, John L. Prince.

    • Text
    • Boston : Kluwer Academic, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 94-212Offsite
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  • Analysis and synthesis of MOS translinear circuits / by Remco J. Wiegerink ; foreword by Evert Seevinck.

    • Text
    • Boston : Kluwer Academic, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 94-618Offsite
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  • Design of MOS VLSI circuits for telecommunications / edited by Yannis Tsividis, Paolo Antognetti.

    • Text
    • Englewood Cliffs, N.J. : Prentice-Hall, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 96-1196Offsite
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  • Gate dielectrics and MOS ULSIs : principles, technologies and applications / Takashi Hori.

    • Text
    • Berlin ; London : Springer, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 97-1601Offsite
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  • Multirate switched-capacitor circuits for 2-D signal processing / by Wang Ping and José E. Franca.

    • Text
    • Boston : Kluwer Academic Publishers, c1998.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 98-410Offsite
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  • Place coding in analog VLSI : a neuromorphic approach to computation / by Oliver Landolt.

    • Text
    • Boston ; London : Kluwer Academic, c1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 98-1261Offsite
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  • Characteristics and operation of MOS field-effect devices.

    • Text
    • New York, McGraw-Hill [1967]
    • 1967
    • 1 Item
    FormatCall NumberItem Location
    Text TTE (Richman, P. Characteristics and operation of MOS field-effect devices)Offsite
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  • Mosfet in circuit design: metal-oxide-semiconductor field-effect transistors for discrete and integrated-circuit technology [by] Robert H. Crawford.

    • Text
    • New York, McGraw-Hill [1967]
    • 1967
    • 1 Item
    FormatCall NumberItem Location
    Text TTE (Crawford, R. H. Mosfet in circuit design)Offsite
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  • Compact low-voltage and high-speed CMOS, BiCMOS, and bipolar operational amplifiers / by Klaas-Jan de Langen and Johan H. Huijsing.

    • Text
    • Boston : Kluwer Academic Publishers, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 99-2157Offsite
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  • Silicon VLSI technology : fundamentals, practice and modeling / James D. Plummer, Michael Deal, Peter B. Griffin.

    • Text
    • Upper Saddle River, NJ : Prentice Hall, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-1580Offsite
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  • Operation and modeling of the MOS transistor / Yannis Tsividis.

    • Text
    • Boston : WCB/McGraw-Hill, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-1408Offsite
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  • Electrothermal analysis of VLSI systems / Yi-Kan Cheng ... [et al.].

    • Text
    • Boston ; London : Kluwer Academic Publishers, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-1909Offsite
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  • Plasma charging damage / Kin P. Cheung.

    • Text
    • London ; [New York] : Springer, c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 01-95Offsite
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  • Effects of cosmic rays on single event upsets [microform] : status report for NAG-5-929 / investigators, D.D. Venable ... [et al.].

    • Text
    • Hampton, VA : Hampton University ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1989]
    • 1989
  • Development of optimized detector/spectrophotometer technology for low background space astronomy missions [microform] : final report / principal investigator, B. Jones.

    • Text
    • Washington, D.C. : NASA Headquarters ; [Springfield, Va. : National Technical Information Service, distributor, 1985?]
    • 1985
  • Analog MOS integrated circuits [microform] : final report / principal investigator, Gabor C. Temes.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
    • 1988
  • To the digital age : research labs, start-up companies, and the rise of MOS technology / Ross Knox Bassett.

    • Text
    • Baltimore : Johns Hopkins University Press, 2002.
    • 2002
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 02-313Offsite
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  • High-K gate dielectrics / edited by Michel Houssa.

    • Text
    • Bristol ; Philadelphia : Institute of Physics, c2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 04-644Offsite
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  • MOS digital electronics / Stephen Shao-chung Cheng.

    • Text
    • Singapore ; Teaneck, NJ, USA : World Scientific, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-820Offsite
    Not available - Please for assistance.
  • Programmable, automated transistor test system [microform] / Long V. Truong and Gale R. Sundburg.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1986.
    • 1986
  • Neutron and gamma irradiation effects on power semiconductor switches [microform] / G.E. Schwarze and A.J. Frasca ; prepared for the 25th Intersociety Energy Conversion Engineering Conference, cosponsored by the AIChE, ANS, SAE, ACS, AIAA, ASME, and IEEE, Reno, Nevada, August 12-17,1990.

    • Text
    • [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1990]
    • 1990
    • 1 Resource

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