Research Catalog

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  • [Sputter process investigation] [microform] : [material and environment interaction processes investigation] : final technical report / John R. Williams, Michael J. Bozack, and Albert T. Fromhold.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • Reflection type skin friction meter [microform] / inventors, Promode R. Bandyopadhyay, Leonard M. Weinstein.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1991

  • A simple antireflection overcoat for opaque coatings in the submillimeter region / Sheldon M. Smith.

    • Text
    • Moffett Field, California : National Aeronautics and Space Administration, Ames Research Center, April 1986.
    • 1986-4
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo65024

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