Research Catalog

  • Atlas of the interpretation of multispectral scanner images : MSS "Fragment", methodology and results / Academy of Sciences of the USSR, Institute of Space Research ... [et al.] ; [editors, R.Z. Sagdeyev ... [et al.].

    • Text
    • Berlin : Akademie Verlag, 1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSH 89-3Offsite
  • Holographic scanning / Leo Beiser.

    • Text
    • New York : Wiley, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-3520Offsite
  • The complete scanner handbook for desktop publishing / David D. Busch.

    • Text
    • Homewood, Ill. : Dow Jones-Irwin, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JBE 91-495Offsite
  • Transcript proceedings, Fulfilling the promise of electronic single source data : a progress report : the organizational impact, case studies, results of the latest analysis : 2nd annual ARF Single Source Data Workshop, the New York Hilton, June 22, 1989.

    • Text
    • New York, NY : Advertising Research Foundation, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JBF 92-1222Offsite
  • Document imaging technology : how automated solutions are revolutionizing the way organizations and people work / Edwin D. McDonell.

    • Text
    • [Chicago, Ill.] : Probus Pub., c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JBE 93-2336Offsite
  • Imaging magazine.

    • Text
    • New York, NY : Telecom Library, c1994-
    • 1994-199
  • Make your scanner a great design & production tool / Michael J. Sullivan.

    • Text
    • Cincinnati, Ohio : North Light Books, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 96-49Offsite
  • Imaging & document solutions.

    • Text
    • San Francisco, Calif. : Miller Freeman, c1998-c2001.
    • 1998-2001
    • 4 Items
    FormatCall NumberItem Location
    Text JSM 98-161 v. 8 (June-Dec. 1999)Offsite
    FormatCall NumberItem Location
    Text JSM 98-161 v. 9 (2000)Offsite
    FormatCall NumberItem Location
    Text JSM 98-161 v. 10, no. 1-4 (Jan.-Apr. 2001)Offsite
  • Imaging : the imaging industry magazine.

    • Text
    • New York, NY : Telecom Library, c1992-c1994.
    • 1992-1994
    • 10 Items
    FormatCall NumberItem Location
    Text JSM 93-260 v. 6 (Jan. -Jun. 1997)Offsite
    FormatCall NumberItem Location
    Text JSM 93-260 v. 7 (June-Oct. 1998)Offsite
    FormatCall NumberItem Location
    Text JSM 93-260 v. 7 (Jan.-May 1998)Offsite
  • Row-by-row scanning systems for IBM punched cards as applied to information retrieval problems / H.P. Luhn.

    • Text
    • Yorktown Heights, N.Y. : International Business Machines Corporation Research Center, 1959.
    • 1959
    • 1 Item
    FormatCall NumberItem Location
    Text VBA p.v. 2201 no. 1-8Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Transform magazine.

    • Text
    • San Francisco, Calif. : CMP Media, 2001-
    • 2001-2005
    • 4 Items
    FormatCall NumberItem Location
    Text JSM 01-114 v. 11 (2002)Offsite
    FormatCall NumberItem Location
    Text JSM 01-114 v. 12 (2003)Offsite
    FormatCall NumberItem Location
    Text JSM 01-114 v. 13 (2004)Offsite
  • Definition and design of an experiment to test raster scanning with rotating unbalanced-mass devices on gimbaled payloads [microform] / W.D. Lightsey, D.C. Alhorn, and M.E. Polites.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1992.
    • 1992
  • Reconfiguring the RUM experiment to test circular scanning with rotating unbalanced-mass devices on gimbaled payloads [microform] / M.E. Polites and D.C. Alhorn.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : For sale by the National Technical Information Service], 1992.
    • 1992
  • Planar near-field scanning for compact range bistatic radar cross-section measurement [microform] / S.R. Tuhela-Reuning and E.K. Walton.

    • Text
    • Columbus, Ohio : Ohio State University, ElectroScience Laboratary ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1991
  • Scanning system for measuring uniformity of laser detector response and laser beam dimensions [microform] / A.L. Rasmussen, W.E. Case, A.A. Sanders.

    • Text
    • Boulder, Colo. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1990]
    • 1990
  • MudScan [microform] : PC based sidescan sonar real-time data acquisition logging and display system / by John T. Gann, Lawrence D. Kooker, and Michael E. Boyle.

    • Text
    • [Menlo Park, Ca.?] : U.S. Dept. of the Interior, U.S. Geological Survey ; a [Denver, Colo. : Books and Open-File Reports Section, distributor, 1993]
    • 1993
  • Low cost attitude control system scanwheel development [microform] : final report / prepared by ITHACO, Inc.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1991
  • Interfacing laboratory instruments to multiuser, virtual memory computers [microform] / Edward R. Generazio, David B. Stang, Don J. Roth.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va. : For sale by the National Technical Information Service], 1989.
    • 1989
  • Defense commissaries [microform] : issues related to the sale of electronic scanner data : report to congressional requesters / United States General Accounting Office.

    • Text
    • Washington, D.C. : The Office ; Gaithersburg, MD (P.O. Box 6015, Gaithersburg 20884-6015) : The Office [distributor, 1998]
    • 1998
  • Calibration experiments of a laser scanner [microform] / Geraldine S. Cheok, Stefan Leigh, Andrew Rukhin.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
    • 2002
  • Three dimensional data capture in indoor environments for autonomous navigation [microform] / J.M. Evans ... [et al.].

    • Text
    • Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
    • 2002
  • The complete guide to scanning / by Larry Ledden.

    • Text
    • Westfield, NY : Family Technologies, c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Text APB 03-2447Schwarzman Building - Milstein Division Room 121

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Scanner data and price indexes / edited by Robert C. Feenstra and Matthew D. Shapiro.

    • Text
    • Chicago ; London : University of Chicago Press, 2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text JBE 03-845Offsite
  • Handbook of optical and laser scanning / edited by Gerald F. Marshall.

    • Text
    • New York : Marcel Dekker, c2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 04-594Offsite
  • Precision pointing using a dual-wedge scanner [microform] / Christopher T. Amirault and Charles A. DiMarzio.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by National Technical Information Service, 1985.
    • 1985
  • Failure of the ERBE scanner instrument aboard NOAA 10 spacecraft and results of failure analysis [microform] / J.B. Miller ... [et al.].

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS58825
  • Concealed weapon detection.

    • Text
    • [Idaho Falls, Idaho] : Idaho National Laboratory, [2005?]
    • 2005
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS103259
  • Herley Industries, Inc.

    • Text
    • Washington, DC : U.S. Govt. Accountability Office, [2009]
    • 2009
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS111224
  • Development of a profiling scanner [electronic resource] / by David Y.T. Chiu and Troy Alexander.

    • Text
    • Adelphi, MD : Army Research Laboratory, [2008]
    • 2008
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS113750
  • Herley Industries, Inc [electronic resource].

    • Text
    • Washington, DC : U.S. Govt. Accountability Office, [2009]
    • 2009
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS111224
  • Luzia Simons / ed. Matthias Harder.

    • Text
    • Berlin : Distanz, 2012.
    • 2012
    • 1 Item
    FormatCall NumberItem Location
    Text JQG 13-459Schwarzman Building - Art & Architecture Room 300

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Scanner data and price indexes [electronic resource] / edited by Robert C. Feenstra and Matthew D. Shapiro.

    • Text
    • Chicago : University of Chicago Press, 2003.
    • 2003
    • 2 Resources

    Available Online

    See All Available Online Resources

  • The negligent eye / [essays by] Chantal Faust, Jo Stockham ; introduction, Bryan Biggs & Sara-Jayne Parsons.

    • Text
    • Liverpool : Bluecoat Press, 2014.
    • 2014
    • 1 Item
    FormatCall NumberItem Location
    Text ReCAP 16-21086Offsite
  • Security Assessment Feasibility for Equipment Testing and Evaluation of Capabilities for Our Homeland Act : report (to accompany H.R. 4561) (including cost estimate of the Congressional Budget Office).

    • Text
    • [Washington, D.C.] : [U. S. Government Publishing Office], [2018]
    • 2018
    • 2 Resources

    Available Online

    See All Available Online Resources

  • Security Assessment Feasibility for Equipment Testing and Evaluation of Capabilities for Our Homeland Act : report (to accompany H.R. 4561) (including cost estimate of the Congressional Budget Office).

    • Text
    • [Washington, D.C.] : [U. S. Government Publishing Office], [2018]
    • 2018
  • Risk management for replication devices / Kelley Dempsey; Celia Paulsen.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
    • 2015
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo102991
  • Ecstatic data sets : the Chorismos Apeiron Scanner (2028 edition) / Late of the Pier.

    • Text
    • [United Kingdom?] : Rough Trade Books, 2018.
    • 2018
    • 1 Item
    FormatCall NumberItem Location
    Text JMD 19-113Performing Arts Research Collections - Music

    Available - Can be used on site. Please visit New York Public Library - Performing Arts Research Collections to submit a request in person.

  • Rotating-unbalanced-mass devices for scanning balloon-borne experiments, free-flying spacecraft, and space shuttle/space station experiments / Michael E. Polites.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; Springfield, VA : For sale by the National Technical Information Service, 1990.
    • 1990
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS60877
  • Digitalis : a plant scan project by Achim Mohné / edited and designed by Uta Kopp.

    • Text
    • Berlin : Hatje Cantz, [2020]
    • 2020-2020
    • 1 Item
    FormatCall NumberItem Location
    Text JQG 21-9Schwarzman Building - Art & Architecture Room 300

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Refracted-ray scanning (refracted near-field scanning) for measuring index profiles of optical fibers / M. Young.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1981.
    • 1981
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo95073
  • Displacement errors in antenna near-field measurements and their effect on the far field / Lorant A. Muth.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1986.
    • 1986
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98435
  • Refracted-ray scanning (refracted near-field scanning) for measuring index profils of optical fibers / M. Young.

    • Text
    • [Washington, D.C.?] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
    • 1981
  • Camera and input scanner systems : 27-28 February 1991, San Jose, California / Win-Chyi Chang, James R. Milch, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; cooperating organization, Center for Imaging Science/Rochester Institute of Technology.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for OpticalEngineering, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text TR882 .C36 1991gOff-site
    Not available - Please for assistance.
  • Final program and proceedings.

    • Text
    • Springfield, VA : IS & T--Society for Imaging Science and Technology
    • 2010-present
    • 7 Items
    FormatCall NumberItem Location
    Text TK8315 .I82 v.20 (2012)Off-site
    FormatCall NumberItem Location
    Text TK8315 .I82 v.20 (2012) CD-ROMOff-site
    FormatCall NumberItem Location
    Text TK8315 .I82 v.21 (2013) w flash driveOff-site
  • Cameras, scanners, and image acquisition systems : 3-4 February 1993, San Jose, California / Helen C. Marz, Robert L. Nielsen, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : SPIE, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .C248 1993Off-site
  • Recording systems : high-resolution cameras and recording devices, laser scanning and recording systems : 21-23 June 1993, Munich, FRG / Leo Beiser, Reimar K. Lenz, chairs/editors ; sponsored by European Optical Society, SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology.

    • Text
    • Bellingham, Wash., USA : SPIE, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .R436 1993gOff-site
  • Digitalis : a plant scan project by Achim Mohné / edited and designed by Uta Kopp.

    • Text
    • Berlin : Hatje Cantz, [2020]
    • 2020-2020
    • 1 Item
    FormatCall NumberItem Location
    Text N6888.M64 A63 2020gOff-site
  • Simultaneous input estimation and system identification for application to ultrasound liver scans / by Jonathan Joseph Kaufman.

    • Text
    • 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text FC83- 7592Off-site
  • Simultaneous input estimation and system identification for application to ultrasound liver scans / by Jonathan Joseph Kaufman.

    • Text
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text LD1237.5D 1982 .K283Off-site
  • Row-by-row scanning systems for IBM punched cards as applied to information retrieval problems / H.P. Luhn.

    • Text
    • Yorktown Heights, N.Y. : International Business Machines Corporation Research Center, 1959.
    • 1959
    • 1 Item
    FormatCall NumberItem Location
    Text 029.25 L9684Off-site

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