Research Catalog

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  • SiC and Si₃N₄ recession due to SiO₂ scale volatility under combustor conditions [microform] / James L. Smialek ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

  • Ablative material testing for low-pressure, low-cost rocket engines [microform] / G. Paul Richter and Timothy D. Smith.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • Physical characterization of SiO₂ aerogel [microform] : phase II, final report, subcontract number: 565-9204 / prepared by J.T. Ryder, J.P. Wittenauer, D.J. Mendez.

    • Text
    • Palo Alto, Calif. : Lockheed Martin, Lockheed Martin Missiles & Space, Advanced Technology Center ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996

  • SiC recession due to SiO₂ scale volatility under combustor conditions [microform] / by Raymond Craig Robinson.

    • Text
    • Brook Park, Ohio : NYMA, Inc. ; [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • First measurements of time-dependent nucleation as a function of composition in Na₂O.2CaO.3SiO₂ glasses [microform] / K. Lakshmi Narayan and K.F. Kelton.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996

  • Measurement of momentum transfer coefficients for H₂, N₂, CO, and CO₂ incident upon spacecraft surfaces [microform] / Steven R. Cook, Mark A. Hoffbauer.

    • Text
    • Houston, Tex. : National Aeronautics and Space Administration, Lyndon B. Johnson Space Center ; Springfield, VA : National Technical Information Service, distributor, [1997]
    • 1997

  • Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity [microform] / Jeannette Benavides.

    • Text
    • Greenbelt, Md. : National Aeronautics and Space Administration, Goddard Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor], 1997.
    • 1997

  • Durability of silica-protected ceramics in combustion atmospheres [microform] / Nathan S. Jacobson... [et al.]

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • Polysiloxanes derived from the controlled hydrolysis of tetraethoxysilane as precursors to silica for use in ceramic processing [microform] / Warren H. Philipp.

    • Text
    • [Washington, D.C. : National Aeronautcs and Space Administration ; Springfield, Va. : For sale by the National Technical Information Service, 1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS62605

  • Sputtered coatings for protection of spacecraft polymers [microform] / Bruce A. Banks ... [et al.].

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration, 1984]
    • 1984
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS99600

  • Study of the lithology, petrology, and rock chemistry for the Pyramid Mountains, New Mexico [microform] / by Sheldon Kerry Grant.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration, 1984?]
    • 1984

  • Optical and scanning electron microscopy of the Materials International Space Station Experiment (MISSE) spacecraft silicone experiment / Ching-cheh Hung and Kim K. de Groh, Bruce A. Banks.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2012]
    • 2012
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo32100

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