Research Catalog
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Displaying 1-6 of 6 results
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system [microform] / Victor A. Carreno, G. Choi and R.K. Iyer.
- Text
- [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va. : National Technical Information Service, distributor], 1990.
- 1990
Heavy ion induced single event phenomena (SEP) data for semiconductor devices form engineering testing [microform] / Donald K. Nichols ... [et al.].
- Text
- Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1988]
- 1988
Effects of cosmic rays on single event upsets [microform] : status report for NAG-5-929 / investigators, D.D. Venable ... [et al.].
- Text
- Hampton, VA : Hampton University ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1989]
- 1989
Upper bound SEU rate for devices in an isotropic or nonisotropic flux [microform] / Larry D. Edmonds.
- Text
- Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1992]
- 1992
The single event effect characteristics of the 486-DX4 microprocessor [microform] : test report / prepared by Coy Kouba, Gwan Choi.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
- 1996
Cosmic ray simulation and testing program : final report / W. A. Kolasinski ... [and others].
- Text
- Los Angeles, CA : Space Sciences Laboratory, the Aerospace Corporation ; Greenbelt, MD : Goddard Space Flight Center, [1985]
- 1985
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo28532
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