Research Catalog

  • Energy dispersion X-ray analysis: X-ray and electron probe analysis / J.C. Russ, coordinator.

    • Text
    • Philadelphia : American Society for Testing and Materials, [1971]
    • 1971
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing and Materials. Special technical publication, no. 485)Offsite
  • Kokuhō jitsugetsu shiki sansuizu kōgaku chōsa hōkokusho : Shingonshū Omuro-ha Daihonzan Amanosan Kongōji shozō / henshū Kokuritsu Bunkazai Kikō Tōkyō Bunkazai Kenkyūjo.

    • Text
    • Tōkyō-to Taitō-ku : Kokuritsu Bunkazai Kikō Tōkyō Bunkazai Kenkyūjo, Reriwa 1 [2019]
    • 2019
    • 1 Item
    FormatCall NumberItem Location
    Text ND1053.4 .K656 2019Off-site
  • Principles and practice of X-ray spectrometric analysis [by] Eugene P. Bertin.

    • Text
    • New York, Plenum Press [1970]
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text 8275.173Off-site
  • Soft x-ray band spectra and the electronic structure of metals and materials / edited by Derek J. Fabian ; based on the proceedings of a conference held at the University of Strathclyde, Scotland, 18-21 September 1967, with support from the Royal Society European Programme and the University of Strathclyde.

    • Text
    • London ; New York : Academic P., 1968.
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Text 8275.267Off-site
  • Methods of X-ray spectroscopic research, by M.A. Blokhin. Translated by F.L. Curzon. Edited by M.A.S. Ross.

    • Text
    • Oxford, New York, Pergamon Press [1965]
    • 1965
    • 1 Item
    FormatCall NumberItem Location
    Text 8294.186Off-site
  • X-ray and electron methods of analysis. Edited by H. Van Olphen and William Parrish.

    • Text
    • New York, Plenum Press, 1968.
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Text 85253.317.1966Off-site
  • Les spectres de rayons X et la structure électronique de la matière. Avec une préf. de N.F. Mott.

    • Text
    • Paris, Centre national de la recherche scientifique, 1948.
    • 1948
    • 1 Item
    FormatCall NumberItem Location
    Text 8294.245Off-site
  • X-ray and inner-shell processes : 18th international conference, Chicago, Illinois, August 1999 : invited presentations / editors, R.W. Dunford [and others].

    • Text
    • Melville, N.Y. : American Institute of Physics, ©2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text QC482.S6 I574 1999Off-site
  • X-ray absorption fine structure-- XAFS 13 : 13th international conference, Stanford, California, USA, 9-14 July, 2006 / editors, Britt Hedman, Piero Pianetta ; sponsoring organization, International XAFS Society.

    • Text
    • Melville, N.Y. : American Institute of Physics, 2007.
    • 2007
    • 1 Item
    FormatCall NumberItem Location
    Text QC482.S6 I573 2006qOff-site
  • X-ray fluorescence spectrometry / Ron Jenkins.

    • Text
    • New York : J. Wiley, ©1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.X2 J47 1988Off-site
  • Quantitative x-ray spectrometry / Ron Jenkins, R.W. Gould, Dale Gedcke.

    • Text
    • New York : M. Dekker, ©1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.X2 J46Off-site
  • XAFS VII : proceedings of the 7th International Conference on X-ray Absorption Fine Structure, Kobe, Japan, August 23-29, 1992 / editors, H. Kuroda [and others] ; co-organized by Japanese Society for Synchrotron Radiation Research (JSSRR) [and others] ; sponsored by Hyogo Prefecture, Kobe City.

    • Text
    • Tokyo, Japan : Publication Office, Japanese Journal of Applied Physics, ©1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text QC482.S6 I573 1992q OversizeOff-site

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