Research Catalog
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Displaying 1-11 of 11 results
Probability of detection of defects in coating with electronic shearography [microform] : final technical report for period 3 June 1993 through 2 June 1994 / prepared by Gary A. Maddux ... [et al.].
- Text
- Huntsville, Ala. : Research Institute, the University of Alabama in Huntsville ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
- 1994
Reliability analysis of uniaxially ground brittle materials [microform] / Jonathan A. Salem ... [et al.].
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
Thermographic imaging for high-temperature composite materials [microform] : a defect detection study / Don J. Roth, James R. Bodis, and Chip Bishop.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
Effects of suction on swept-wing transition [microform] : final technical report on NASA-Langley award # NAG-1-194, 16 December 1995 to 31 March 1998 / by William S. Saric.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1998]
- 1998
An investigation of the effect of surface impurities on the adsorption kinetics of hydrogen chemisorbed onto iron [microform] : final technical report; NASA-Ames cooperative agreement no. NCC2-63; April 1, 1980 to September 30, 1997 / M.R. Shanabarger.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Use of high-T[subscript c] superconducting magnetic sensors for nondestructive evaluation of subsurface defects [microform] : final report / principal investigator, John H. Miller, Jr.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1998]
- 1998
Why are buckyonions round? [microform] / Kevin R. Bates and Gustavo E. Scuseria.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Least squares best fit method for the three parameter Weibull distribution [microform] : analysis of tensile and bend specimens with volume or surface flaw failure / Bernard Gross.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1996.
- 1996
Boundary-layer receptivity due to distributed surface imperfections of a deterministic or random nature [microform] / Meelan Choudhari.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.
- 1992
- 1 Resource
Available Online
http://purl.access.gpo.gov/GPO/LPS59390Edge crack growth in thermally aged graphite/polyimide composites [microform] / James B. Nelson.
- Text
- Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1984]
- 1984
Least squares best fit method for the three parameter Weibull distribution : analysis of tensile and bend specimens with volume or surface flaw failure / Bernard Gross.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, July 1996.
- 1996-7
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo65364
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