Research Catalog

  • Characterization of radiation damage by transmission electron microscopy / M.L. Jenkins, M.A. Kirk.

    • Text
    • Bristol, UK ; Philadelphia : Institute of Physics Pub., c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 01-349Offsite
    Not available - Please for assistance.
  • Transmission electron microscope studies of extraterrestrial materials [microform] : final technical report for NASA contract NAS 9-18992 / prepared by Lindsay P. Keller.

    • Text
    • Norcross, Ga. : MVA, Inc. ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Structural characterization and gas reactions of small metal particles by high-resolution, in-situ tem and ted [microform].

    • Text
    • Sunnyvale, CA : Eloret Institute ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1984]
    • 1984
  • Structural characterization and gas reactions of small metal particles by high-resolution, in-situ tem and ted [microform] : semi-annual technical report for the period January 1, 1985 to June 30, 1985 / K. Heinemann.

    • Text
    • Sunnyvale, CA : Eloret Institute ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1985]
    • 1985
  • Structural characterization and gas reactions of small metal particles by high resolution in-situ TEM and TED [microform] : semi-annual technical report for the period, July 1, 1985 - September 30, 1985, NSDS-grant NCC2-283 / principal investigator, K. Heinemann.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1985]
    • 1985
  • Structural characterization and gas reactions of small metal particles by high resolution in-situ TEM and TED [microform] : periodic technical report ... for the period, January 1, 1986-December 31, 1986 / prepared by Eloret Institute ; Klaus Heinemann, president and principal investigator.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987
  • Soot precursor material [microform] : visualization via simultaneous LIF-LII and characterization via TEM / Randall L. Vander Wal.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996
  • Microstructural characterization of aluminum-lithium alloys 1460 and 2195 [microform] / Z.M. Wang and R.N. Shenoy.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; Springfield, VA : National Technical Information Service [distributor, 1998]
    • 1998
  • Surface diagnostics in tribology technology and advanced coatings development [microform] / Kazuhisa Miyoshi.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999
  • Progress in transmission electron microscopy / Xiao-Feng Zhang, Ze Zhang (eds.).

    • Text
    • Beijing : Tsinghua University Press ; Berlin ; New York : Springer, c2001.
    • 2001
    • 2 Items
    FormatCall NumberItem Location
    Text JSE 02-2 v. 1Offsite
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text JSE 02-2 v. 2Offsite
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  • High-resolution imaging and spectrometry of materials / F. Ernst, M. Rühle (eds.).

    • Text
    • Berlin ; New York : Springer, c2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 03-133Offsite
    Not available - Please for assistance.
  • Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state / Andreas Rosenauer.

    • Text
    • Berlin ; New York : Springer, c2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 03-950Offsite
    Not available - Please for assistance.
  • High-resolution electron microscopy / John C.H. Spence.

    • Text
    • Oxford ; New York : Oxford University Press, 2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 03-1096Offsite
    Not available - Please for assistance.
  • TEM study of precipitation in a NiAl-3Ti-0.5Hf single-crystal alloy [microform] / A. Garg ... [et al.].

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration, 1997]
    • 1997-1996
  • Transmission electron microscopy characterization of microstructural features in Al-Li-Cu alloys [microform] / M. Avalos-Borja, P.P. Pizzo, and L. A. Larson.

    • Text
    • Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center, [1983]
    • 1983
  • Design of the transmission electron microscope (TEM) sampler scriber template as developed to improve and simplify the sample preparation procedure / Wendy L. Sarney.

    • Text
    • Adelphi, MD : Army Research Laboratory, [2007]
    • 2007
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS109899
  • Vergleichende Untersuchungen der Kristallperfektion dünner heteroepitaktischer Wolfram-Einkristallschichten mit unterschiedlichem Mosaik-Spread mittels MeV-H+- und He+- Rutherford-Ionenrückstreuung, Röntgen-Zweikristall-Diffraktometrie und Tranmissions-Elektronenmikroskopie.

    • Text
    • Jülich [Germany] : Kernforschungsanlage Jülich, Institut für Festkörperforschung, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text ReCAP 12-49043Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate / Hyun Jung Kim ... [and others].

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
    • 2012
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo30968
  • Synthesis and characterization of cobalt-containing nanoparticles on alumina : a potential catalyst for gas-to-liquid fuels production / Jonathan Cowen, Aloysius F. Hepp.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, September 2016.
    • 2016-9
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo73023
  • Boron nitride nanoribbons from exfoliation of boron nitride nanotubes / Ching-cheh Hung, Janet Hurst, and Diana Santiago.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, April 2017.
    • 2017-4
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo81325
  • Transmission electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.

    • Text
    • Berlin ; New York : Springer-Verlag, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 R43 1993Off-site
    Not available - Please for assistance.
  • Fundamentals of high-resolution transmission electron microscopy / S. Horiuchi.

    • Text
    • Amsterdam ; New York : North-Holland, 1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 F85 1994Off-site
    Not available - Please for assistance.
  • Energy-filtering transmission electron microscopy / Ludwig Reimer (ed.).

    • Text
    • Heidelberg, Germany ; New York : Springer-Verlag, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 E54 1995Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy : a textbook for materials science / David B. Williams and C. Barry Carter.

    • Text
    • New York : Plenum Press, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .W56 1996Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.

    • Text
    • Berlin ; New York : Springer, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 R43 1997Off-site
    Not available - Please for assistance.
  • Specimen preparation for transmission electron microscopy of materials IV : symposium held April 2, 1997, San Francisco, California, U.S.A. / editors, Ronald M. Anderson, Scott D. Walck.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .S633 1997Off-site
    Not available - Please for assistance.
  • Biological specimen preparation for transmission electron microscopy / Audrey M. Glauert, Peter R. Lewis.

    • Text
    • Princeton, N.J. : Princeton University Press, [1998], ©1998.
    • 1998-1998
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 P7 v.17Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.

    • Text
    • Berlin ; New York : Springer, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .F85 2001Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.

    • Text
    • Berlin ; New York : Springer, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .F85 2002Off-site
    Not available - Please for assistance.
  • High-resolution imaging and spectrometry of materials / F. Ernst and M. Rühle (eds.).

    • Text
    • New York : Springer, 2002.
    • 2002
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .H534 2002Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state / Andreas Rosenauer.

    • Text
    • New York : Springer, 2003.
    • 2003
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text 508 Er38 v.182Off-site
    Not available - Please for assistance.
  • Female reproductive system: dynamics of scan and transmission electron microscopy [by] Alex Ferenczy [and] Ralph M. Richart.

    • Text
    • New York, Wiley [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text RG107.5.R3 F37 1974Off-site
    Not available - Please for assistance.
  • Biological electron microscopy : theory, techniques, and troubleshooting / Michael J. Dykstra and Laura E. Reuss.

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 D95 2003Off-site
    Not available - Please for assistance.
  • Electron tomography : methods for three-dimensional visualization of structures in the cell / edited by J. Frank.

    • Text
    • New York ; London : Springer, 2006.
    • 2006
    • 1 Item
    FormatCall NumberItem Location
    Text QH324.9.T45 E64 2006Off-site
    Not available - Please for assistance.
  • Aberration-corrected imaging in transmission electron microscopy : an introduction / Rolf Erni.

    • Text
    • 2010
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 E76 2010gOff-site
    Not available - Please for assistance.
  • Transmission electron microscopy : a textbook for materials science / David B. Williams and C. Barry Carter.

    • Text
    • New York : Plenum Press, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .W56 1996Off-site
    Not available - Please for assistance.
  • Male reproductive system : fine structure analysis by scanning and transmission electron microscopy / Robert D. Yates, Mildred Gordon.

    • Text
    • New York : Masson Pub., c1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text RC877.Y37Off-site
    Not available - Please for assistance.
  • Energy-filtering transmission electron microscopy / Ludwig Reimer (ed.) ; with contributions by C. Deininger ... [et. al].

    • Text
    • Heidelberg, Germany ; New York : Springer-Verlag, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 E54 1995Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy of silicon VLSI circuits and structures / R.B. Marcus and T.T. Sheng.

    • Text
    • New York : Wiley, ©1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M26 1983Off-site
    Not available - Please for assistance.
  • Male reproductive system : fine structure analysis by scanning and transmission electron microscopy / Robert D. Yates, Mildred Gordon.

    • Text
    • New York : Masson Pub., ©1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text RC877.Y37Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 R43 1984Off-site
    Not available - Please for assistance.
  • Basic techniques for transmission electron microscopy / M.A. Hayat.

    • Text
    • Orlando : Academic Press, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 H39 1986Off-site
    Not available - Please for assistance.
  • Transmission electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.

    • Text
    • Berlin ; New York : Springer-Verlag, ©1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.T7 R43 1989Off-site
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