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Fault-tolerance through reconfiguration of VLSI and WSI arrays / R. Negrini, M.G. Sami, R. Stefanelli.
- Text
- Cambridge, Mass. : MIT Press, ©1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text QA76.9.F38 N44 1989 Off-site 1990 proceedings : International Conference on Wafer Scale Integration, January 23-25, 1990, San Francisco, California, USA / sponsored by IEEE Computer Society, IEEE Components, Hybrids, and Manufacturing Technology Society ; edited by Joe Brewer and Michael J. Little.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, ©1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I578 1990 Off-site
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