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Displaying 1-2 of 2 results for author "Abelson, John Robert."
Medium-range order in amorphous silicon measured by fluctuation electron microscopy : final report, 23 June 1999-23 August 2002 / P.M. Voyles and J.R. Abelson.
- Text
- Golden, Colo. : National Renewable Energy Laboratory, [2003]
- 2003
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/LPS49899Amorphous and nanocrystalline silicon science and technology--2004 : Symposium held April 13-16, 2004, San Francisco, California, U.S.A. / editors, Gautam Ganguly [and others].
- Text
- Warrendale, Pa. : Materials Research Society, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.A45 A45 2004g Off-site
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