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Displaying 1-4 of 4 results for author "Alexe, M. (Marin)"
Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).
- Text
- Berlin ; New York : Springer-Verlag, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSE 04-1202 Offsite Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach / M. Alexe, A. Gruverman, eds.
- Text
- Berlin ; New York : Springer-Verlag, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSE 06-1137 Offsite Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).
- Text
- Berlin ; New York : Springer-Verlag, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .W27 2004 Off-site Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach / M. Alexe, A. Gruverman, eds.
- Text
- Berlin ; New York : Springer-Verlag, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text TA418.9.N35 N3445 2004 Off-site
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