Research Catalog

  • Contacts to semiconductors : fundamentals and technology / edited by Leonard J. Brillson.

    • Text
    • Park Ridge, N.J. : Noyes, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK7872.C68 C66 1993Off-site
  • Frontiers in electronic materials & processing : Houston, Texas, November 1985 / editor, L.J. Brillson.

    • Text
    • New York : American Institute of Physics, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871 .F76Off-site
  • Surface and interface analysis of microelectronic materials processing and growth : 12-13 October 1989, Santa Clara, California / Leonard J. Brillson, Fred H. Pollak, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations: Center for Advanced Electronic Materials Processing/North Carolina State University, Engineering Research Center for Plasma-Aided Manufacturing/University of Wisconsin-Madison, SEMATECH.

    • Text
    • Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1990], ©1990.
    • 1990-1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .S868 1990gOff-site
  • Frontiers in electronic materials & processing : Houston, Texas, November 1985 / editor, L.J. Brillson.

    • Text
    • New York : American Institute of Physics, 1986.
    • 1986
    • 1 Item

    Available Online

    http://scitation.aip.org/content/aip/proceeding/aipcp/138
    FormatCall NumberItem Location
    Text TK7871 .F76Off-site
  • Surface and interface analysis of microelectronic materials processing and growth : 12-13 October 1989, Santa Clara, California / Leonard J. Brillson, Fred H. Pollak, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations: Center for Advanced Electronic Materials Processing, North Carolina State University, Engineering Research Center for Plasma-Aided Manufacturing, University of Wisconsin-Madison, SEMATECH.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .S973Off-site

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