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Displaying 1-6 of 6 results for author "Chen, Philip T."
1997 Spacecraft Contamination and Coatings Workshop [microform] / organized by Philip T. Chen, Steve M. Benner ; sponsored by National Aeronautics and Space Administration, Office of Space Science, Space Environments and Effects Program.
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- Greenbelt, Md. : National Aeronautics and Space Administration, Goddard Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor], 1997.
- 1997
Optical systems contamination and degradation : 20-23 July 1998, San Diego, California / Philip T. Chen, William E. McClintock, Gary J. Rottman, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TL946 .O64 1998 Off-site Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado / Philip T. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
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- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TA418.7 .R66 1999g Off-site Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TL946 .O64 2000 Off-site Optical system contamination : effects, measurements, and control VII : 9-11 July, 2002, Seattle, [Washington] USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) [and others].
- Text
- Bellingham, Washington : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text QC372 .O6 2002g Off-site Optical systems degradation, contamination and stray light: effects, measurements, and control : 2-5 August, 2004, Denver, Colorado, USA / Philip T.C. Chen, John C. Fleming, Michael G. Dittman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text TL946 .O673 2004g Off-site
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