Research Catalog

  • Semiconductor device reliability / edited by A. Christou and B.A. Unger.

    • Text
    • Dordrecht ; Boston : Kluwer Academic Publishers, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 90-663Offsite
  • Reliability of gallium arsenide MMICs / edited by Aris Christou.

    • Text
    • Chichester ; New York : Wiley, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7876 .R445 1992Off-site
  • Electromigration and electronic device degradation / edited by Aris Christou.

    • Text
    • New York, NY, USA : Wiley, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .E477 1994Off-site
  • Semiconductor device reliability : proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989 / edited by A. Christou and B.A. Unger.

    • Text
    • Dordrecht ; Boston : Kluwer Academic Publishers, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .N3758 1989Off-site
  • Gallium arsenide and related compounds 1987 : proceedings of the fourteenth International Symposium on Gallium Arsenicle and Related Compounds, held in Heraklion, Crete, 28 September-1 October 1987./ edited by A. Christou and H.S. Rupprecht.

    • Text
    • Bristol, England; Philadelphia, PA, USA : Institute of Physics, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QC611.8.G3 I57 1987Off-site
  • Reliability of gallium arsenide MMICs / edited by Aris Christou.

    • Text
    • Chichester ; New York : Wiley, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7876 .R445 1992Off-site
  • Reliability of gallium arsenide MMICs / edited by Aris Christou.

    • Text
    • Chichester ; New York : Wiley, ©1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7876 .R445 1992Off-site

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