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Displaying 1-5 of 5 results for author "Ehrstein, James R."
Standard reference materials : preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1985.
- 1985
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo100183Spreading resistance symposium / James R. Ehrstein.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1974.
- 1974
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo104600Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, James R. Ehrstein.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1979.
- 1979
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95955Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 / James R. Ehrstein, editor.
- Text
- Washington : U.S. Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S67 1974 Off-site Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, Solecon Laboratories, and James R. Ehrstein, Electron Devices Division, Center for Electronics & Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
- Text
- Washington : Department of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-48 Off-site
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