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Displaying 1-21 of 21 results for author "IEEE Reliability Society."
IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers, 1988-
- 1988-present
- 20 Items
Item details Format Call Number Item Location Text JSP 88-143 v. 20, no. 3 (Aug. 2007) Offsite Item details Format Call Number Item Location Text JSP 88-143 v. 20, no. 1-2 (Feb.-May 2007) Offsite Item details Format Call Number Item Location Text JSP 88-143 v. 21, no. 1 (Feb. 2008) Offsite IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers, c2001-
- 2001-present
- 3 Items
Item details Format Call Number Item Location Text JSM 01-193 v. 1-4,v. 5, no. 2-4 (Mar. 2001-Dec. 2004,June-Dec. 2005) Offsite Item details Format Call Number Item Location Text JSM 01-193 v. 6-v. 7, no. 1-2,4 (Mar. 2006-June,Dec. 2007) Offsite Item details Format Call Number Item Location Text JSM 01-193 v. 8, no. 1 (Mar. 2008) Offsite 1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- [New York] : IEEE Electron Devices Society : IEEE Reliability Society, [1994?]
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I583 1994g Off-site 1995 International Integrated Reliability Workshop : final report, Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, NJ : IEEE Service Center, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I583 1995g Off-site 1996 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- [New York] : IEEE Electron Devices Society : IEEE Reliability Society, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I4735 1996 Off-site IEEE transactions on reliability.
- Text
- [New York, Institute of Electrical and Electronics Engineers]
- 1952-present
- 39 Items
Item details Format Call Number Item Location Text TK7800 .In75 R v.53 (2004) Off-site Item details Format Call Number Item Location Text TK7800 .In75 R v.54 (2005) Off-site Item details Format Call Number Item Location Text TK7800 .In75 R v.55 (2006) Off-site Reliability physics / [International Reliability Physics Symposium].
- Text
- New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers
- 1970-present
- 36 Items
Item details Format Call Number Item Location Text TK7870 .R451 39th (2001) Off-site Item details Format Call Number Item Location Text TK7870 .R451 40th (2002) Off-site Item details Format Call Number Item Location Text TK7870 .R451 41st (2003) Off-site 1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, New Jersey : IEEE Electron Devices Society : IEEE Reliability Society, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I583 1997g Off-site 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, New Jersey : IEEE Electron Devices Society : IEEE Reliability Society, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I583 1998g Off-site Proceedings of 2nd Electronic Packaging Technology Conferenc : [8-10 December, 1998, Raffles City Convention Center, Singapore] / edited by Andrew A.O. Tay, Lim Thian Beng ; organised by IEEE Reliability/CPMT/ED Singapore Chapter [and others].
- Text
- Piscataway, New Jersey : IEEE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7870.15 .E453 1998g Off-site 1999 Pacific Rim International Symposium on Dependable Computing : proceedings : December 16-17, 1999, Hong Kong / sponsored by IEEE Hong Kong Section Computer Chapter ; in co-operation with IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Reliability Society ; with the support of Chinese University of Hong Kong [and others].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text QA76.9.F38 P33 1999g Off-site 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I583 1999g Off-site 2000 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I4735 2000g Off-site IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers, ©2001-
- 2001-present
- 6 Items
Item details Format Call Number Item Location Text TK7870.23 .I34 v.4 (2004) Off-site Item details Format Call Number Item Location Text TK7870.23 .I34 v.5 (2005) Off-site Item details Format Call Number Item Location Text TK7870.23 .I34 v.6 (2006) Off-site 2001 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I4735 2001g Off-site Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2002 / edited by John Thong [and others] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
- Text
- Piscataway, New Jersey : IEEE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I584 2002g Off-site 2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Text
- Piscataway, N.J. : IEEE Society, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I583 2002g Off-site Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled: 7 to 11 July, 2003, Singapore] / edited by Philip Ho ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
- Text
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I584 2003g Off-site IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers, ©1988-
- 1988-present
- 17 Items
Item details Format Call Number Item Location Text TK7836 .I39 v.17 (2004) Off-site Item details Format Call Number Item Location Text TK7836 .I39 v.18 (2005) Off-site Item details Format Call Number Item Location Text TK7836 .I39 v.19 (2006) Off-site IEEE transactions on semiconductor manufacturing.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers, c1988-
- 1988-present
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I33 vol. 17 2004 Off-site Reliability physics : annual proceedings.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers, c1974-c1993.
- 1974-1993
- 3 Items
Item details Format Call Number Item Location Text TK7870 .xI5 1981 Off-site Item details Format Call Number Item Location Text TK7870 .xI5 1988 Off-site Item details Format Call Number Item Location Text TK7870 .xI5 1992 Off-site
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