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Displaying 1-9 of 9 results for author "Jones, Susan K."
Selling by mail : an entrepreneurial guide to direct marketing / John W. Graham, Susan K. Jones.
- Text
- New York : Scribner's, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JLD 86-799 Offsite Selling by direct mail : an entrepreneurial guide to direct marketing / John W. Graham and Susan K. Jones ; foreword by Peter Tomkins.
- Text
- London : Piatkus, 1988.
- 1988-1985
- 1 Item
Item details Format Call Number Item Location Text JLD 89-1813 Offsite Time-management for executives : a handbook from the editors of Execu-time / Lauren Robert Januz and Susan K. Jones.
- Text
- New York : Scribner, [1982], ©1981.
- 1982-1981
- 1 Item
Item details Format Call Number Item Location Text HF5500.2 .J34 1982 Off-site Metrology, inspection, and process control for microlithography X : 11-13 March, 1996, Santa Clara, California / Susan K. Jones, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering; cooperating organizations SEMI--Semiconductor Equipment and Materials International, SEMATECH.
- Text
- Bellingham, Wash., USA : SPIE, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I5554 1996g Off-site Metrology, inspection, and process control for microlithography XI : 10-12 March, 1997, Santa Clara, California / Susan K. Jones, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations SEMI--Semiconductor Equipment and Materials International, SEMATECH.
- Text
- Bellingham, Washington : SPIE, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I5554 1997g Off-site Selling by mail : an entrepreneurial guide to direct marketing / John W. Graham, Susan K. Jones.
- Text
- New York : Scribner's, [1985], ©1985.
- 1985-1985
- 1 Item
Item details Format Call Number Item Location Text HF5466 .G67 1985 Off-site Metrology, inspection, and process control for microlithography X : : 11-13 March, 1996, Santa Clara, California / Susan K. Jones, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering; cooperating organizations SEMI--Semiconductor Equipment and Materials International, SEMATECH.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2725 Off-site Metrology, inspection, and process control for microlithography XI : 10-12 March, 1997, Santa Clara, California / Susan K. Jones, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations SEMI--Semiconductor Equipment and Materials International, SEMATECH.
- Text
- Bellingham, Wash. : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.3050 Off-site Metrology, inspection, and process control for microlithography X : : 11-13 March, 1996, Santa Clara, California / Susan K. Jones, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering; cooperating organizations SEMI--Semiconductor Equipment and Materials International, SEMATECH.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2725 Off-site
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