Research Catalog

  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-1899Offsite
  • Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors, C.V. Thompson, J.R. Lloyd.

    • Text
    • Pittsburgh, Penn. : Materials Research Society, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1387Offsite
  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3443 1991Off-site
  • Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors, C.V. Thompson, J.R. Lloyd.

    • Text
    • Pittsburgh, PA : Materials Research Society, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3442 1992Off-site
  • Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging / edited by J.R. Lloyd [and others].

    • Text
    • Pennington, NJ : Electrochemical Society, [1985], ©1985.
    • 1985-1985
    • 1 Item
    FormatCall NumberItem Location
    Text TN690 .S895 1984Off-site

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