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Displaying 1-5 of 5 results for author "Miller, John W. V."
Machine vision applications, architectures, and systems integration VI : 15-16 October 1997, Pittsburgh, Pennsylvania / Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems.
- Text
- Bellingham, Wash., USA : SPIE, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TA1632 .M32 1997g Off-site Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts / John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TA1632 .M3313 1999g Off-site Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts / Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers.
- Text
- Bellingham, Wash. : SPIE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TA1634 .M3355 1998 Off-site Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TA1634 .M33 2001g Off-site Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October, 2001, Boston, [Massachusetts] USA / Kevin G. Harding, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Washington : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TA1634 .M33 2002g Off-site
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