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Displaying 1-10 of 10 results for author "Monahan, Kevin M."
Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA / Alfred K.K. Wong, Kevin M. Monahan, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7874 .C67 2003g Off-site Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California / Kevin M. Monahan, chairman/editor ; cooperating organizations, Optical Sciences Center/University of Arizona, Institute of Optics/University of Rochester.
- Text
- Bellingham, Wash., USA : SPIE--International Society for Optical Engineering, 1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874 .M488 1985 Off-site Integrated circuit metrology, inspection, and process control : 4-6, March 1987, Santa Clara, California / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I5426 1987g Off-site Integrated circuit metrology, inspection, and process control II : 29 February-1 March 1988, Santa Clara, California / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I54682 1988 Off-site Integrated circuit metrology, inspection, and process control III : 27-28 February 1989, Los Angeles, California / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text TK787 .I54683 1989g Off-site Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California / Kevin M. Monahan, chairman/editor ; cooperating organizations, Optical Sciences Center/University of Arizona, Institute of Optics/University of Rochester.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874 .M52 Off-site Integrated circuit metrology, inspection, and process control : [papers] / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, 4-6 March 1987, Santa Clara, California.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874 .I5468 1987 Off-site Integrated circuit metrology, inspection, and process control II : 29 February-1 March 1988, Santa Clara, California / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874 .I54682 Off-site Integrated circuit metrology, inspection, and process control III : 27-28 February 1989, Los Angeles, California / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874.I54683 Off-site Integrated circuit metrology, inspection, and process control II : 29 February-1 March 1988, Santa Clara, California / Kevin M. Monahan, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874 .I54682 Off-site
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