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Displaying 1-2 of 2 results for author "National Institute of Standards and Technology (U.S.). Semiconductor Electronics Division."
Semiconductor measurement technology [microform] : evolution of silicon materials characterization : lessons learned for improved manufacturing / W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology"
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., 1993.
- 1993
Implementation of simulation program for modeling the effective resistivity of nanometer scale film and line interconnects / A. Emre Yarimbiyik [and others].
- Text
- [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2006]
- 2006
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo99378
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