Research Catalog

  • Test report for single event effects of the 80386dx microprocessor [microform] / R. Kevin Watson, Harvey R. Schwartz, Donald K. Nichols.

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993
  • Heavy ion induced single event phenomena (SEP) data for semiconductor devices form engineering testing [microform] / Donald K. Nichols ... [et al.].

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1988]
    • 1988
  • A comparison of radiation damage in linear ICs from Cobalt-60 gamma rays and 2.2-MeV electrons [microform] / Michael K. Gauthier, Donald K. Nichols.

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]
    • 1983

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