Research Catalog

  • Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland / Maksymilian Pluta, editor ; Mariusz Szyjer, Ewa Powichrowska, coeditors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland).

    • Text
    • Bellingham, Wash., USA : SPIE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text QC367 .L54 2001gOff-site
  • Lightmetry 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland / Maksymilian Pluta, Mariusz Szyjer, editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text QC367 .L53 2002gOff-site
  • Optical security and safety : 11-12 December, 2003, Warsaw, Poland : SOS'03 / Zbigniew Jaroszewicz, Ewa Powichrowska, Mariusz Szyjer, chairs/editors ; organized by, Institute of Applied Optics (Poland), SPIE Poland Cahpter ; sponsored by Ministry of Economy, Labour and Social Policy of Poland ; published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : SPIE, [2004], ©2004.
    • 2004-2004
    • 1 Item
    FormatCall NumberItem Location
    Text TA1542 .S97 2003gOff-site

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