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Displaying 1-11 of 11 results for author "Rajsuman, Rochit."
Bridging faults and IDDQ testing / [edited] by Yashwant K. Malaiya and Rochit Rajsuman.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Book/Text JSF 94-557 Offsite Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1993g Off-site Records of the IEEE International Workshop on Memory Technology, Design and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, in cooperation with the IEEE Computer Society Technical Committee on VLSI.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1994g Off-site Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1995g Off-site Proceedings : International Workshop on Memory Technology, Design, and Testing / edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1997g Off-site Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore / edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1996g Off-site Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA / edited by R. Rajsuman and T. Wik ; sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, in cooperation with the IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1999g Off-site Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2000g Off-site Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, Calfornia / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1995 Off-site Records of the 1996 IEEE International Workshop on Memory Technology, Design and Testing, August 13-14, 1996, Singapore / edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1996 Off-site Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.
- Text
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1994 Off-site
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