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  • Quantitative mapping of pore fraction variations in silicon nitride using an ultrasonic contact scan technique [microform] / Don J. Roth ... [et al.].

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1993.
    • 1993

  • Imaging subtle microstructural variations in ceramics with precision ultrasonic velocity and attenuation measurements [microform] / Edward R. Generazio, Don J. Roth, and George Y. Baaklini.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987

  • Spatial variations in A.C. susceptibility and microstructure for the YBa₂Cu₃O₇₋x superconductor and their correlation with room-temperature ultrasonic measurements [microform] / Don J. Roth ... [et al.].

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1991

  • Interfacing laboratory instruments to multiuser, virtual memory computers [microform] / Edward R. Generazio, David B. Stang, Don J. Roth.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va. : For sale by the National Technical Information Service], 1989.
    • 1989

  • Dynamic porosity variations in ceramics [microform] / Generazio, Edward R., Stang, David B., Roth, Don J.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1988]
    • 1988

  • An NDE approach for characterizing quality problems in polymer matrix composites [microform] / Don J. Roth ... [et al.].

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1995]
    • 1995

  • Commercial implementation of ultrasonic velocity imaging methods via cooperative agreement between NASA Lewis Research Center and Sonix, Inc. [microform] / Don J. Roth.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996

  • PSIDD (II): [microform] : a protoype post-scan interactive data display system for detailed analysis of ultrasonic scans / Wei Cao and Don J. Roth.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • 3-D surface depression profiling using high frequency focused air-coupled ultrasonic pulses [microform] / Don J. Roth ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Springfield, VA : National Technical Information Service, distributor, [1999]
    • 1999

  • Scaling up the single transducer thickness-independent ultrasonic imaging method for accurate characterization of microstructural gradients in monolithic and composite tubular structures [microform] / Don J. Roth ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, VA : National Technical Information Service, distributor, [1998]
    • 1998

  • Precision thickness variation mapping via one-transducer ultrasonic high resolution profilometry for sample with irregular or rough surface [microform] / Don J. Roth, inventor.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996

  • A method of Poisson's ration imaging within a material part [microform] / inventor, Don J. Roth.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • Using high frequency focused water-coupled ultrasound for 3-D surface depression profiling [microform] / Don J. Roth ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

  • LabVIEW interface concepts used in NASA scientific investigations and virtual instruments [microform] / Don J. Roth ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2001]
    • 2001
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS23045

  • Development of a high performance acousto-ultrasonic scan system [microform] / D.J. Roth ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2002]
    • 2002
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS43730

  • Probability of detection of internal voids in structural ceramics using microfocus radiography [microform] / George Y. Baaklini and Don J. Roth.

    • Text
    • [Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, 1985]
    • 1985

  • Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride [microform] / George Y. Baaklini, James D. Kiser, and Don J. Roth.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, [1985]
    • 1985

  • Nonuniform transition conductivity of superconducting ceramic / Edward R. Generazio, Don J. Roth, and Aloysius F. Hepp.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, [1989]
    • 1989
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS108148

  • Nonuniform transition conductivity of superconducting ceramic [microform] / Edward R. Generazio, Don J. Roth, and Aloysius F. Hepp.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, [1989]
    • 1989
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS108148

  • PSIDD (II) : a prototype post-scan interactive data display system for detailed analysis of ultrasonic scans / Wei Cao and Don J. Roth.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, June 1997.
    • 1997-6
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo72102

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