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Displaying 1-4 of 4 results for author "Shwop, John E."
Semiconductor reliability.
- Text
- Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]
- 1961-1962
- 2 Items
Item details Format Call Number Item Location Text TTE (Semiconductor reliability) v. 1 Offsite Item details Format Call Number Item Location Text TTE (Semiconductor reliability) v. 2 Offsite Semiconductor reliability.
- Text
- Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York, [1961-62]
- 1961-1962
- 2 Items
Item details Format Call Number Item Location Text TK7872.S4 Se52 v.2 Off-site Item details Format Call Number Item Location Text TK7872.S4 Se52 v.1 Off-site Semiconductor reliability.
- Text
- Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]
- 1961-1962
- 2 Items
Item details Format Call Number Item Location Text 92956.853 vol.2 Off-site Item details Format Call Number Item Location Text 92956.853 vol.1 Off-site Semiconductor reliability.
- Text
- Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]
- 1961-1962
- 2 Items
Item details Format Call Number Item Location Text 92956.853 vol.1 Off-site Item details Format Call Number Item Location Text 92956.853 vol.2 Off-site
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