Research Catalog

  • International Symposium on Optical Fabrication, Testing, and Surface Evaluation : 10-12 June 1992, Tokyo, Japan / Jumpei Tsujiuchi, conference chair/editor ; sponsored by SPIE Japan Chapter ; cooperating organizations, SPIE--the International Society for Optical Engineering [and others].

    • Text
    • Bellingham, Wash. : SPIE, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TS510 .I58 1992gOff-site
  • International Conference on Optical Fabrication and Testing : 5-7 June, 1995, Tokyo, Japan / Toshio Kasai, chair/editor ; sponsored by: SPIE Japan Chapter; SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : SPIE, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text QC410.9 .I59 1995gOff-site
  • International Conference on Applications of Optical Holography : 5-7 June, 1995, Tokyo, Japan / Toshio Honda, chair/editor ; sponsored by: SPIE Japan Chapter; SPIE--the International Society for Optical Engineering [and others].

    • Text
    • Bellingham, Wash. : SPIE, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1540 .I578 1995gOff-site
  • Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan / Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter [and others] ; published by SPIE--The International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text QC440 .I57 1996gOff-site
  • Photomask and X-ray mask technology III : 18-19 April, 1996, Kawasaki City, Kanagawa, Japan / Hideo Yoshihara, editor ; sponsored by Photomask Japan, BACUS, SPIE--the International Society for Optical Engineering ; cosponsored by Japan Chapter of SPIE [and others].

    • Text
    • Bellingham, Wash. : SPIE, [1965], ©1965.
    • 1965-1965
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .P46 1996gOff-site
  • Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan / Naoaki Aizaki, editor ; sponsored by Photomask Japan, BACUS, SPIE--the International Society for Optical Engineering ; supporting societies, the Japan Society of Applied Physics [and others] ; published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Washington : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .P46 1997gOff-site
  • Microlithographic techniques in IC fabrication : 25-26 June, 1997, Singapore / Soon-Fatt Yoon, Raymond Yu, Chris A. Mack, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter [and others] ; cooperating organizations Nanyang Technological University (Singapore) [and others] ; published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Washington : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7835 .M435 1997gOff-site
  • Microelectronic packaging and laser processing : 25-26 June, 1997, Singapore / Yong Khim Swee, Hong Yu Zheng, Ray T. Chen, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, Institute of Physics, Singapore ; cosponsored by SPIE Japan Chapter [and others] ; cooperating organizations Nanyang Technological University (Singapore) [and others] ; published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Washington : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M459 1997gOff-site
  • Automatic inspection and novel instrumentation : 25-26 June 1977, Singapore / Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter [and others] ; cooperating organizations, Nanyang Technological University (Singapore) [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TS156.2 .A88 1997gOff-site
  • Neugebauer Memorial Seminar on Color Reproduction : 14-15 December 1989, Tokyo, Japan / Kazuo Sayanagi, chair/editor ; sponsored by: Japan Chapter of SPIE--the International Society for Optical Engineering ; cooperating organizations: SPIE--the International Society for Optical Engineering [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1990], ©1990.
    • 1990-1990
    • 1 Item
    FormatCall NumberItem Location
    Text QC495.8 .N48 1989gOff-site
  • International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 10-12 June 1992, Tokyo, Japan / Jumpei Tsujiuchi, conference chair/editor ; sponsored by SPIE Japan Chapter ; cooperating organizations, SPIE--the International Society for Optical Engineering [and others].

    • Text
    • Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TA1522 .I583 1992Off-site

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