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Displaying 1-3 of 3 results for author "United States. Navy Strategic Systems Projects Office."
The destructive bond pull test / John Albers, editor ; Electronic Technology Division.
- Text
- [Washington] : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-18 Off-site Not available - Please for assistance.Planar test structures for characterizing impurities in silicon / M. G. Buehler [and others] ; Electronic Technology Division.
- Text
- Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-21 Off-site Not available - Please for assistance.Microelectronic test pattern NBS-3 for evaluating the resistivity-dopaut density relationship of silicon / Martin G. Buehler ; Electronic Technology Division.
- Text
- Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-22 Off-site Not available - Please for assistance.
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