Research Catalog

  • Reliability engineering, prepared by the engineering and statistical staff of ARINC Research Corporation. Edited by William H. Von Alven.

    • Text
    • Englewood Cliffs, N.J., Prentice-Hall [1964]
    • 1964
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (ARINC Research Corporation, Washington, D.C. Reliability engineering)Offsite
  • Semiconductor reliability.

    • Text
    • Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]
    • 1961-1962
    • 2 Items
    FormatCall NumberItem Location
    Text TTE (Semiconductor reliability) v. 1Offsite
    FormatCall NumberItem Location
    Text TTE (Semiconductor reliability) v. 2Offsite
  • Semiconductor reliability.

    • Text
    • Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York, [1961-62]
    • 1961-1962
    • 2 Items
    FormatCall NumberItem Location
    Text TK7872.S4 Se52 v.2Off-site
    FormatCall NumberItem Location
    Text TK7872.S4 Se52 v.1Off-site
  • Reliability engineering, prepared by the engineering and statistical staff of ARINC Research Corporation. Edited by William H. Von Alven.

    • Text
    • Englewood Cliffs, N.J., Prentice-Hall [1964]
    • 1964
    • 1 Item
    FormatCall NumberItem Location
    Text TA168.A16 1964Off-site
  • Semiconductor reliability.

    • Text
    • Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]
    • 1961-1962
    • 2 Items
    FormatCall NumberItem Location
    Text 92956.853 vol.2Off-site
    FormatCall NumberItem Location
    Text 92956.853 vol.1Off-site
  • Semiconductor reliability.

    • Text
    • Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62]
    • 1961-1962
    • 2 Items
    FormatCall NumberItem Location
    Text 92956.853 vol.1Off-site
    FormatCall NumberItem Location
    Text 92956.853 vol.2Off-site

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