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Displaying 1-2 of 2 results for author "Berning, David W."
A programmable reverse-bias safe operating area transistor tester [microform] / D.W. Berning.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1990.
- 1990
A reverse-bias safe operating area transistor tester / David W. Berning, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
- Text
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-54 Off-site
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