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Displaying 1-3 of 3 results for author "Christou, A."
Integrating reliability into microelectronics manufacturing / Aris Christou.
- Text
- Chichester ; New York : Wiley, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text JSF 95-17 Offsite Integrating reliability into microelectronics manufacturing / Aris Christou.
- Text
- Chichester ; New York : Wiley, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7874 .C5448 1994 Off-site Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics / A. Christou ; Naval Research Laboratory.
- Text
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-30 Off-site
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