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Displaying 1-2 of 2 results for author "Dickey, David H."
Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, James R. Ehrstein.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1979.
- 1979
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95955Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, Solecon Laboratories, and James R. Ehrstein, Electron Devices Division, Center for Electronics & Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
- Text
- Washington : Department of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-48 Off-site
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