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Displaying 1-4 of 4 results for author "Ehrstein, James R."
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
- 1997
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1999.
- 1999
Standard reference materials : preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1985.
- 1985
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo100183Spreading resistance symposium / James R. Ehrstein.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1974.
- 1974
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo104600
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