Research Catalog

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  • Specification of interactions in integrated manufacturing systems [microform] / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
    • 2000

  • State models for jobs and job supervisors [microform] / David Flater, Edward Barkmeyer, Evan Wallace.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
    • 1997

  • Testability of product data management interfaces [microform] / David Flater, KC Morris.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
    • 1999

  • Automated composition of conversion software / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
    • 2004
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99399

  • Relativity of explicit conceptual models / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
    • 2004
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo103750

  • Rendering UML activity diagrams as human-readable text / David Flater; Philippe A. Martin; Michelle L. Crane.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2007.
    • 2007
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo101581

  • A rational foundation for software metrology / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
    • 2016
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo96077

  • Configuration of profiling tools for C/C++ applications under 64-bit Linux / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
    • 2013
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo96442

  • Estimation of uncertainty in application profiles / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
    • 2014
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo96723

  • Screening for factors affecting application performance in profiling measurements / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
    • 2014
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo102557

  • Defensive code's impact on software performance / David Flater.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
    • 2015
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo95798

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