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Displaying 1-2 of 2 results for author "International Test Conference (15th : 1984 : Philadelphia, Pa.)"
The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSF 85-139 Offsite The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press, ©1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I593 1984 Off-site
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