Research Catalog

  • Interfacial phenomena in metals and alloys / L. E. Murr ; [illustrated by the author].

    • Text
    • Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 76-201Offsite
  • Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.

    • Text
    • New York : Marcel Dekker, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 83-370Offsite
  • Information highways : mapping information delivery networks in the Pacific Northwest / written, compiled, and composed by Lawrence E. Murr, James B. Williams, Ruth-Ellen Miller.

    • Text
    • Portland, Or. (P.O. Box 23452, Portland 97223) : Hypermap, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text Map Div. 86-660Schwarzman Building - Map Division Room 117

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • What every engineer should know about material and component failure, failure analysis, and litigation / Lawrence E. Murr.

    • Text
    • New York : M. Dekker, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-1949Offsite
  • Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.

    • Text
    • New York : M. Dekker, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 M87 1991Off-site
  • Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.

    • Text
    • New York : Marcel Dekker, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 M87 1982Off-site
  • Electron optical applications in materials science.

    • Text
    • New York : McGraw-Hill, [1970]
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.5 .M87Off-site
  • What every engineer should know about material and component failure, failure analysis, and litigation / Lawrence E. Murr.

    • Text
    • New York : M. Dekker, [1987], ©1987.
    • 1987-1987
    • 1 Item
    FormatCall NumberItem Location
    Text TA409 .M86 1987Off-site
  • Electron optical applications in materials science.

    • Text
    • New York, McGraw-Hill [1970]
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.5 .M87Off-site
  • Solid-state electronics / Lawrence E. Murr.

    • Text
    • New York : M. Dekker, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text TK7835.M87Off-site
  • Interfacial phenomena in metals and alloys / Lawrence E. Murr ; with a foreword by Morris Cohen.

    • Text
    • Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text TN690 .M87Off-site
  • What every engineer should know about material and component failure, failure analysis, and litigation / Lawrence E. Murr.

    • Text
    • New York : M. Dekker, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text TA409 .M86 1987Off-site
  • Electron optical applications in materials science.

    • Text
    • New York, McGraw-Hill [1970]
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.5 .M87Off-site
  • Solid-state electronics / Lawrence E. Murr.

    • Text
    • New York : M. Dekker, ©1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text TK7835.M87Off-site

No results found from Digital Research Books Beta

Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.

digital-research-book
Explore Digital Research Books Beta