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  • Wide temperature characteristics of transverse magnetically annealed amorphous tapes for high frequency aerospace magnetics [microform] / Janis M. Niedra.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

  • Wide temperature magnetization characteristics of transverse magnetically annealed amorphous tapes for high frequency aerospace magnetics [microform] / Janis M. Niedra, Gene E. Schwarze.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

  • Wide temperature core loss characteristics of transverse magnetically annealed amorphous tapes for high frequency aerospace magnetics [microform] / Janis M. Niedra, Gene E. Schwarze.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

  • Effects of hydrogen annealing, sulfur segregation, and diffusion on the cyclic oxidation resistance of superalloys [microform] : a review / J.L. Smialek ... [et al.].

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • A study on the precipitation and reversion behaviors of Cu-0.3% Cr alloy by the step annealing method [microform] / K. Nagata and S. Nishikawa.

    • Text
    • Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va.? : National Technical Information Service, distributor, 1988]
    • 1988

  • Linear response theory for annealing of radiation damage in semiconductor devices [microform] : summary report / Dr. V. Litovchenko.

    • Text
    • Washington, DC : Catholic University of America : [National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
    • 1988

  • An X-ray diffraction study of titanium oxidation [microform] / by K.E. Wiedemann, J. Unnam.

    • Text
    • Warrendale, PA : Metallurgical Society of AIME ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1984]
    • 1984

  • Activities of the Solid State Physics Research Institute [microform].

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1984]
    • 1984

  • The interaction of small metal particles with refractory oxide supports [microform] / Ch. Park, K. Heinemann.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1985]
    • 1985

  • Effects of thermal treatment on tensile creep and stress-rupture behavior on Hi-Nicalon SiC fibers [microform] / H.M. Yun, J.C. Goldsby, adn J.A. DiCarlo.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • Ellipsometric study of YBa₂Cu₃O₇₋x laser ablated and co-evaporated films [microform] / S.A. Alterovitz ... [et al.] ; prepared for the International Conference on Electronic Materials 1990, sponsored by the Materials Research Society, Newark, New Jersey, September 17-19, 1990.

    • Text
    • [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1990?]
    • 1990

  • The effects of interstitial content and annealing on the flow and fracture behavior and polycrystalline β-NiA1 [microform] / M.L. Weaver ... [et al.].

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • Sulfur impurities and the microstructure of alumina scales [microform] / James L. Smialek.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • Creep and rupture strength of an advanced CVD SiC fiber [microform] / J.C. Goldsby, H.M. Yun, James A. DiCarlo.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • Observations of static strain-aging in polycrystalline NiAl [microform] / M.L. Weaver ... [et al.].

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996

  • Incipient melt formation and devitrification at the Wanapitei impact structure, Ontario, Canada [microform] / B.O. Dressler, D. Crabtree, and B.C. Schuraytz.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • Evaluation of the effect of microalloying on cleavage of monocrystalline NiAl using a miniaturized disk-bend test [microform] : summary of research for the period March 1, 1992 to March 6, 1996; National Aeronautics and Space Administration, grant no. NAG 3-1325 / Alan J. Ardell, principal investigator.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425̊C [microform] / Liang-Yu Chen ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, Va. : National Technical Information Service, distributor, [1998]
    • 1998

  • Annealing effects on creep and rupture of polycrystalline alumina-based fibers [microform] / J.C. Goldsby ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1998]
    • 1998

  • Comparative stress corrosion cracking and general corrosion resistance of annealed and hardened 440C stainless steel [microform] : new techniques in stress corrosion testing / M.J. Mendreck ... [et al.].

    • Text
    • [Huntsville, Ala.] : National Aeronautics and Space Administration, Marshall Space Flight Center ; Springfield, VA : National Technical Information Service, distributor, [1998]
    • 1998

  • The effect of hydrogen annealing on the oxidation resistance of four EPM single crystal superalloys [microform] / James L. Smialek, Charles A. Barrett, Ralph G. Garlick.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2001]
    • 2001
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS23321

  • Lateral spreading of Au contacts on InP [microform] / Navid S. Fatemi and Victor G. Weizer ; prepared for the 1990 spring meeting of the Materials Research Society, San Francisco, California, April 16-21, 1990.

    • Text
    • [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1990?]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS69906

  • Process research in polycrystalline silicon material (PROPSM) [microform] : quarterly report no. 3, April 1, 1984 through June 30, 1984 / by J.S. Culik.

    • Text
    • [Pasadena, Calif.? : Jet Propulsion Laboratory, 1984]
    • 1984

  • Pulsed excimer laser processing for cost-effective solar cells [microform] : quarterly report no. 2, August - October 1984 / prepared by D. Wong, principal investigator.

    • Text
    • Chatsworth, Calif. : ARCO Solar, Inc. ; [Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, 1984]
    • 1984

  • Characterization of ceramic powders by an X-ray measuring method [microform] / G. Ziegler.

    • Text
    • Washington, D.C. : National Aeronautics and Space Administration, [1983]
    • 1983

  • Tensile properties of GRCop-84 / David L. Ellis, William S. Loewenthal, Hee Man Yun.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2012]
    • 2012
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo27902

  • Experiences with serial and parallel algorithms for channel routing using simulated annealing / by Randall Jay Brouwer.

    • Text
    • Hampton, Va. : NASA Langley Research Center, [1988]
    • 1988
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo31695

  • Experiences with serial and parallel algorithms for channel routing using simulated annealing [microform] / by Randall Jay Brouwer.

    • Text
    • Hampton, Va. : NASA Langley Research Center, [1988]
    • 1988

  • Creep and rupture strength of an advanced CVD SiC fiber / J.C. Goldsby, H.M. Yun, James A. DiCarlo.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, April 1997.
    • 1997-4
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo70699

  • Sulfur impurities and the microstructure of alumina scales / James L. Smialek.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, April 1997.
    • 1997-4
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo70713

  • Surface and interface study of PdCr/SiC Schottky diode gas sensor annealed at 425 °C / Liang-Yu Chen [and three others].

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, May 1998.
    • 1998-5
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo82964

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