Research Catalog
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Displaying 1-5 of 5 results
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.].
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 2000]
- 2000
Preliminary study of electron emission for use in the PIC portion of MAFIA [microform] / Jon C. Freeman.
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2001]
- 2001
- 1 Resource
Available Online
http://purl.access.gpo.gov/GPO/LPS26852Advanced electric propulsion research, 1990 [microform] : annual report / Jeffery M. Monheiser ; approved by Paul J. Wilbur.
- Text
- [Cleveland, Ohio] : Lewis Research Center, National Aeronautics and Space Administration ; [Springfield, Va. : For sale by National Technical Information Service, 1991]
- 1991
- 1 Resource
Available Online
http://purl.access.gpo.gov/GPO/LPS59908Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / C.M. Schnabel [and six others].
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, February 2000.
- 2000-2
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo85917Preliminary study of electron emission for use in the PIC portion of MAFIA / Jon C. Freeman.
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, June 2001.
- 2001-6
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/LPS26852
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