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Displaying 1-50 of 280 results
The optical transfer function [by] K. R. Barnes. With a pref. by W. D. Wright.
- Text
- New York, American Elsevier Pub. Co. [1971]
- 1971
- 1 Item
Item details Format Call Number Item Location Text JSF 72-336 Offsite 75 Jahre Abteilung für Optische Messinstrumente. 1893-1968. ([Hrsg.:] Carl Zeiss, Oberkochen, Württ. Für d. Inhalt verantwortl.: Harald Volkmann. Schriftl.: Herbert Gottschalk.)
- Text
- Aalen/Württ., Theiss (1968).
- 1968
- 1 Item
Item details Format Call Number Item Location Text JSG 72-138 Offsite Optical transforms [edited by] H. Lipson.
- Text
- London, New York, Academic Press, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSE 73-355 Offsite Optical instruments and technique 1969: proceedings of the conference held at the University of Reading during 14th-19th July, 1969, under the auspices of the International Commission for Optics and arranged by the Optical Sub-Committee of the British National Committee for Physics; edited by Home Dickson.
- Text
- Newcastle-upon-Tyne, Oriel P., 1970.
- 1970
- 1 Item
Item details Format Call Number Item Location Text JSE 73-659 Offsite Optische Distanzmessung: Doppelbild oder Distanzfäden. [Von] J[ohannes] C[ornelius] O[be] van Gijsen. With a summary: Optical measurement: double-image or stadia haris. Met een samenvatting: Optische afstandmeting: dubbelbeeld of afstandsraden.
- Text
- Wageningen, Centrum voor Landbouwpublikaties en Landbouwdocumentatie: ['s Gravenh., Staatsuitgeverij] 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text JSE 74-572 Offsite Optical methods in ultrancentrifugation, electrophoresis, and diffusion; with a guide to the interpretation of records, by Peter H. Lloyd.
- Text
- Oxford, Clarendon Press, 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSE 74-1740 Offsite Měření a vytváření tenkých vrstev v optice.
- Text
- Praha, Nakl. Československé akademie věd, 1957.
- 1957
- 1 Item
Item details Format Call Number Item Location Text XLS-6 Sv. 4, Sv. 11, Sv. 14 Offsite Optical shop testing / edited by Daniel Malacara.
- Text
- New York : Wiley, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 78-1332 Offsite Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements, Tokyo, 26-30 August 1974. Edited by Shun-ichi Tanaka.
- Text
- Tokyo, Japanese Journal of Applied Physics, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 78-765 Offsite Optical radiation measurements.
- Text
- New York, Academic Press, 1979-
- 1979-present
- 5 Items
Item details Format Call Number Item Location Text JSP 80-270 v. 3 Offsite Item details Format Call Number Item Location Text JSP 80-270 v. 4 Offsite Item details Format Call Number Item Location Text JSP 80-270 v. 5 Offsite Measurement of suspended particles by quasi-elastic light scattering / edited by Barton E. Dahneke.
- Text
- New York : Wiley, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSE 85-446 Offsite Optical measurements in fluid mechanics 1985 : proceedings of the VI International Conference on Photon Correlation and Other Techniques in Fluid Mechanics held in Churchill College, Cambridge, 10-12 July 1985 / edited by P.H. Richards.
- Text
- Bristol, England ; Boston : A. Hilger, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSK 77-69 no. 77 v. 77 (1985) Offsite Proceedings of the Inspection, Measurement and Control and Laser Diagnostics and Photochemistry, ICALEO '84 / editors, Donald Sweeney Robert Lucht ; organized in cooperation with ... The American Ceramic Society ... [et al.]
- Text
- Toledo, OH : LIA-Laser Institute of America, 1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSF 86-969 Offsite Fast electrical and optical measurements / edited by James E. Thompson, Lawrence H. Luessen ; editorial committee, Anthony K. Hyder ... [et al.].
- Text
- Dordrecht ; Boston : Martinus Nijhoff, 1986.
- 1986
- 2 Items
Item details Format Call Number Item Location Text JSE 86-1685 v. 1 Offsite Item details Format Call Number Item Location Text JSE 86-1685 v. 2 Offsite Optical metrology / Kjell J. Gåsvik.
- Text
- Chichester[West Sussex] ; New York : Wiley, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSE 87-2717 Offsite Optical sensing techniques and signal processing / Tudor E. Jenkins.
- Text
- Englewood Cliffs, NJ : Prentice-Hall, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSE 88-2583 Offsite Optical metrology : coherent and incoherent optics for metrology, sensing and control in science, industry, and biomedicine / edited by Olivério D.D. Soares.
- Text
- Dordrecht ; Boston : M. Nijhoff, 1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSE 87-1606 Offsite Physical optics and light measurements / edited by Daniel Malacara.
- Text
- Boston : Academic Press, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 88-1034 Offsite Introduction to the optical transfer function / Charles S. Williams and Orville A. Becklund.
- Text
- New York : Wiley, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSE 89-812 Offsite The physics of moire metrology / Oded Kafri, Ilana Glatt.
- Text
- New York : Wiley, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSE 91-452 Offsite Optical 3-D measurement techniques : applications in inspection, quality control, and robotics : papers presented to the conference organized at Vienna, Austria, September 18-20, 1989 / [edited by] A. Gruen, H. Kahmen.
- Text
- Karlsruhe : Wichmann, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSD 91-233 Offsite Formation and control of optical wavefronts / edited by P.P. Pashinin ; translated by Kevin S. Hendzel.
- Text
- Commack, NY : Nova Science Publishers, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSE 92-480 Offsite Optical components, systems, and measurement techniques / Rajpal S. Sirohi, Mahendra P. Kothiyal.
- Text
- New York : M. Dekker, c1991.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSE 92-933 Offsite Optical measurements in the printing industry [by] J.M. Adams.
- Text
- Oxford, New York, Pergamon Press [1965]
- 1965
- 1 Item
Item details Format Call Number Item Location Text PEO (Adams, J. M. Optical measurements in the printing industry) 1965 Offsite Colorimétrie.
- Text
- Paris, Editions de la Revue d'Optique théorique et instrumentale, 1951.
- 1951
- 1 Item
Item details Format Call Number Item Location Text PEO (Blottiau, F. Colorimetrie) 1951 Offsite Einführung in die Messung der optischen Grundgrössen.
- Text
- Karlsruhe, G. Braun, 1954.
- 1954
- 1 Item
Item details Format Call Number Item Location Text PEO (Flugge, J. Einfuhrung in die Messung der optischen Grundgrossen) 1954 Offsite Engineering optics; the principles of optical methods in engineering measurement, by K. J. Habell and Arthur Cox.
- Text
- London, I. Pitman, 1948.
- 1948
- 1 Item
Item details Format Call Number Item Location Text PEB (Habell, K. J. Engineering optics) 1948 Offsite Outlines of applied optics, by P. G. Nutting ... with 73 illustrations.
- Text
- Philadelphia, P. Blakiston's son & co., 1912.
- 1912
- 1 Item
Item details Format Call Number Item Location Text PED (Nutting, P. G. Outlines of applied optics) 1912 Offsite Die optische Werkstatt; handbuch der arbeitsverfahren und Prüfmethoden für die Fertigung von Optik, von Dr. Waldemar Ewald. Unter Mitarbeit von Dr. Hans Schulz und Dr. Franz Weidert mit 169 Textabbildungen und 3 Interpolationstafeln.
- Text
- Berlin, Gebrüder Borntraeger, 1930.
- 1930
- 1 Item
Item details Format Call Number Item Location Text PEH (Ewald, W. Optische Werkstatt) 1930 Offsite Optik in der Längenmesstechnik.
- Text
- Berlin, Verlag Technik (1966)
- 1966
- 1 Item
Item details Format Call Number Item Location Text PEH (Hodam, F. Optik in der Langenmesstechnik. 1966) 1966 Offsite Optics in metrology; [colloquium] 6-9 May 1958, edited by Pol Mollet.
- Text
- Oxford, New York, Pergamon Press, 1960.
- 1960
- 1 Item
Item details Format Call Number Item Location Text PEH (International Commission on Optics. Optics in metrology) 1960 Offsite Mess- und Prüfmethoden der optischen Fertigung.
- Text
- Berlin, Akademie-Verlag, 1953-
- 1953-present
- 1 Item
Item details Format Call Number Item Location Text PEH (Picht, J. Mess- und Prufmethoden der optischen Fertigung) Library has: Bd.1 1953 Offsite Anleitung zu optischen untersuchungen mit dem polarisa-tionsmikroskop, von F. Rinne und M. Berek. Mit 335 abbildungen im text und einem bildnis von F. Rinne.
- Text
- Leipzig, Dr. Max Janecke, 1934.
- 1934
- 1 Item
Item details Format Call Number Item Location Text PWX (Rinne, F. Anleitung zu optischen untersuchungen mit dem polarisa-tionsmikroskop) Offsite Anleitung zu optischen Untersuchungen mit dem Polarisa tionsmikroskop, Aufl. von Max. Berek. Hrsg. von C.H. Claussen, A. Driesen und S. Rösch.
- Text
- Stuttgart, E. Schweizerbart, 1953.
- 1953
- 1 Item
Item details Format Call Number Item Location Text PWX (Rinne, F. Anleitung zu optischen Untersuchungen mit dem Polarisationsmikroskop) Offsite Engineering precision measurements.
- Text
- London : Chapman and Hall, 1944.
- 1944
- 1 Item
Item details Format Call Number Item Location Text VBDN (Judge, A. W. Engineering precision measurements) Offsite Engineering precision measurements.
- Text
- London, Chapman & Hall, 1957.
- 1957
- 1 Item
Item details Format Call Number Item Location Text VBDN (Judge, A. W. Engineering precision measurements) Offsite Interferogram analysis for optical testing / Daniel Malacara, Manuel Servín, Zacarias Malacara.
- Text
- New York : Marcel Dekker, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text JSE 98-1189 Offsite Optical methods of measurement : wholefield techiques / Rajpal S. Sirohi, Fook Siong Chau.
- Text
- New York : Marcel Dekker, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSE 99-1491 Offsite Adaptive optics engineering handbook / edited by Robert K. Tyson.
- Text
- New York : Marcel Dekker, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSE 00-700 Offsite Concentrator testing using projected images [microform] / Kent S. Jefferies.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
- 1991
Research and development of optical measurement techniques for aerospace propulsion research [microform] : a NASA Lewis Research Center perspective / Daniel J. Lesco.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
- 1991
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1992.
- 1992
Advanced smoke meters for jet engine exhaust measurement [microform] / prepared by Robert W. Pitz.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1986]
- 1986
Precision spectroscopy, diode lasers, and optical frequency measurement technology [microform] : selected publications of the Optical Frequency Measurement Group of the Time and Frequency Division / edited by Leo Hollberg ... [et al.].
- Text
- Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1998.
- 1998
Opti̊ceskie izmereni︠i︡a. [Ůcebnik dl︠i︡a vuzov po spe̜tialwnosti "Opti̊c. pribory i spektroskopi︠i︡a." Izd. 2-e].
- Text
- Moskva, "Nedra," 1968.
- 1968
- 1 Item
Item details Format Call Number Item Location Text *QH 77-1543 Offsite Optical metrology / Kjell J. Gåsvik.
- Text
- West Sussex, Eng. ; Hoboken, N.J. : J. Wiley & Sons, c2002.
- 2002
- 1 Item
Available Online
http://www.loc.gov/catdir/toc/wiley023/2002072607.htmlItem details Format Call Number Item Location Text JBF 03-951 Offsite Optical sensing and measurement : proceedings of the 7th International Congress on Applications of Lasers and Electrooptics ICALEO '88, 30 October-4 November, 1988, Santa Clara, CA, USA / Aaron D. Gara (editor).
- Text
- Berlin ; New York : Springer-Verlag ; UK : IFS Publications Ltd., c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSF 95-131 Offsite Characterization of luminance probe for accurate contrast measurements in medical displays [microform] / Edward F. Kelley, Aldo Badano.
- Text
- Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003]
- 2003
Interferometric metrology of photomask blanks [microform] : approaches using 633 nm wavelength / C.J. Evans ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
- 2000
Optical measurement of propeller blade deflections [microform] / Anatole P. Kurkov.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1988.
- 1988
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