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  • Specular reflection [by] E. P. Lavin. With a pref. by W. D. Wright.

    • Text
    • London, A. Hilger [1971]
    • 1971
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 72-682Offsite

  • Das Totalreflectometer und das Refractometer für Chemiker, ihre Verwendung in der Krystalloptik und zur Untersuchung der Lichtbrechung von Flüssigkeiten.

    • Text
    • Leipzig, W. Engelmann, 1890.
    • 1890
    • 1 Item
    FormatCall NumberItem Location
    Text PEO (Pulfrich, C. Totalreflectometer und das Refractometer fur Chemiker)Offsite

  • Impacts on state and local agencies for maintaining traffic signs within minimum retroreflectivity guidelines [microform].

    • Text
    • McLean, VA : U.S. Dept. of Transportation, Federal Highway Administration, Research and Development, Turner-Fairbank Highway Research Center ; [Springfield, VA : Available to the public through the National Technical Information Service, 1998]
    • 1998

  • An analysis of the effects of secondary reflections on dual-frequency reflectometers [microform] / C.P. Hearn, C.R. Cockrell, S.D. Harrah.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1990]
    • 1990

  • Optical rock dust meter field evaluation / by M.J. Sapko, N. Greninger, and H. Perlee.

    • Text
    • Washington, D.C. (2401 E St., N.W., MS #9800, Washington 20241-0001) : U.S. Dept. of the Interior, Bureau of Mines, 1991.
    • 1991

  • The MRIS feasibility study [microform] / Robert T. Neece, Aubrey E. Cross, and James H. Schrader.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

  • Microwave reflectometer ionization sensor [microform] / Joseph Seals ... [et al.].

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

  • Determining soil volumetric moisture content using time domain reflectometry [microform].

    • Text
    • McLean, VA : U.S. Dept. of Transportation, Federal Highway Administration, Research and Development, Turner-Fairbank Highway Research Center ; [Springfield, VA : Available to the public through the National Technical Information Service, 1998]
    • 1998

  • Backscatter signature simulations / B. L. Danielson.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1981.
    • 1981
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98190

  • Optical time-domain reflectometer performance and calibration studies / B. L. Danielson.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1983.
    • 1983
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo103677

  • Characterization of an optical time domain reflectometer calibrator / Donald R. Larson.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2006.
    • 2006
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo97782

  • Multimode fiber launch study : estimating the impact of measurements of propagation delay / Tasshi Dennis.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
    • 2010
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo97352

  • Spectroscopic ellipsometry and reflectometry : a user's guide / Harland G. Tompkins, William A. McGahan.

    • Text
    • New York : Wiley, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text QC443 .T63 1999Off-site

  • Occhio, misura e rilievo : gli strumenti ottici e catottrici per l'architettura e il recupero del Collegio dei gesuiti a Genova / Cristina Càndito.

    • Text
    • Firenze : Alinea, 2005.
    • 2005
    • 1 Item
    FormatCall NumberItem Location
    Text QC425.4 .C36 2005gOff-site

  • Laser-source integrating sphere reflectometer / Gerhart J. Kneissl and Joseph C. Richmond, a report to Air Force Materials Laboratory, Research and Technology Division, Air Force Systems Command, Wright-Patterson Air Force Base, Ohio.

    • Text
    • Washington : U.S. National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. , 1968.
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Text 8209.528Off-site

  • Das Totalreflectometer und das Refractometer für Chemiker, ihre Verwendung in der Krystalloptik und zur Untersuchung der Lichtbrechung von Flüssigkeiten.

    • Text
    • Leipzig, W. Engelmann, 1890.
    • 1890
    • 1 Item
    FormatCall NumberItem Location
    Text 8273.74Off-site

  • Das Totalreflectometer und das Refractometer für Chemiker, ihre Verwendung in der Krystalloptik und zur Untersuchung der Lichtbrechung von Flüssigkeiten.

    • Text
    • Leipzig, W. Engelmann, 1890.
    • 1890
    • 1 Item
    FormatCall NumberItem Location
    Text 8273.74Off-site

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