Research Catalog
New! Try our Article Search to discover online journals, books, and more from home with your library card.
Displaying 1-50 of 52 results
Near field optics / edited by Dieter W. Pohl and Daniel Courjon.
- Text
- Dordrecht ; Boston : Kluwer Academic, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 93-1475 Offsite Not available - Please for assistance.Scanning tunneling microscopy III : theory of STM and related scanning probe methods / R. Wiesendanger, H.-J. Güntherodt (eds.).
- Text
- Berlin ; New York : Springer-Verlag, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 93-1562 Offsite Not available - Please for assistance.Forces in scanning probe methods / edited by H.-J. Güntherodt, D. Anselmetti and E. Meyer.
- Text
- Dordrecht ; Boston : Kluwer Academic in cooperation with NATO Scientific Affairs Division, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSE 95-1000 Offsite Not available - Please for assistance.Photons and local probes / edited by Othmar Marti and Rolf Möller.
- Text
- Dordrecht ; Boston : Kluwer Academic Pub., c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSE 95-2224 Offsite Not available - Please for assistance.Scanning tunneling microscopy III : theory of STM and related scanning probe methods / R. Wiesendanger, H.-J. Güntherodt (eds.).
- Text
- Berlin ; New York : Springer, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text JSE 97-233 Offsite Not available - Please for assistance.Exploring scanning probe microscopy with Mathematica / Dror Sarid.
- Text
- New York : Wiley, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text JSE 97-1648 Offsite Not available - Please for assistance.Scanning probe microscopy of polymers / Buddy D. Ratner, editor, Vladimir V. Tsukruk, editor.
- Text
- Washington, DC : American Chemical Society : Distributed by Oxford University Press, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text JSE 98-1000 Offsite Not available - Please for assistance.Bringing scanning probe microscopy up to speed / by S.C. Minne, S.R. Manalis, C.F. Quate.
- Text
- Boston : Kluwer, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSE 00-193 Offsite Not available - Please for assistance.Impact of electron and scanning probe microscopy on materials research / edited by David G. Rickerby, Giovanni Valdrè and Ugo Valdrè.
- Text
- Dordrecht ; Boston, MA : Kluwer Academic Publishers, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSE 00-172 Offsite Not available - Please for assistance.Scanning probe lithography / by Hyongsok T. Soh, Kathryn Wilder Guarini, Calvin F. Quate.
- Text
- Boston ; London : Kluwer Academic Publishers, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSE 01-1424 Offsite Not available - Please for assistance.Scanning tunneling microscopy/spectroscopy and related techniques : 12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003 / editors, P.M. Koenraad, M. Kemerink.
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 2 Items
Available Online
http://proceedings.aip.org/proceedings/confproceed/696.jspItem details Format Call Number Item Location Text *WSC-3654 Offsite Not available - Please for assistance.Item details Format Call Number Item Location Text JSE 04-320 [Text] Offsite Not available - Please for assistance.Applications of scanned probe microscopy to polymers / James D. Batteas, editor, Chris A. Michaels, editor, Gilbert C. Walker, editor ; sponsored by the ACS Division of Polymeric Chemistry, Science and Engineering, Inc.
- Text
- Washington, DC : American Chemical Society, 2005.
- 2005
- 1 Item
Item details Format Call Number Item Location Text JSE 05-763 Offsite Not available - Please for assistance.Force microscopy : applications in biology and medicine / edited by Bhanu P. Jena, J.K. Heinrich Hörber.
- Text
- Hoboken, N.J. : Wiley-Liss, c2006.
- 2006
- 1 Item
Item details Format Call Number Item Location Text JSF 06-520 Offsite Not available - Please for assistance.Instrumental community [electronic resource] : probe microscopy and the path to nanotechnology / Cyrus C. M. Mody.
- Text
- Cambridge, MA : The MIT Press, 2011 .
- 2011
- 2 Resources
Available Online
See All Available Online Resources
Scanning tunneling microscopy III : theory of STM and related scanning probe methods / R. Wiesendanger, H.-J. Güntherodt (eds.).
- Text
- Berlin ; New York : Springer-Verlag, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text QH212.S35 S253 1993 Off-site Not available - Please for assistance.Scanned probe microscopy : Santa Barbara, CA, 1991 / H. Kumar Wickramasinghe, editor.
- Text
- New York : American Institute of Physics, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 S36 1992 Off-site Not available - Please for assistance.Forces in scanning probe methods / edited by H.-J. Güntherodt, D. Anselmetti and E. Meyer.
- Text
- Dordrecht ; London : Kluwer Academic in cooperation with NATO Scientific Affairs Division, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 N372 1994g Off-site Not available - Please for assistance.Near-field optics : 9-10 July, 1995, San Diego, California / Micheal A. Paesler, Patrick J. Moyer, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 N43 1995 Off-site Not available - Please for assistance.Scanning tunneling microscopy III : theory of STM and related scanning probe methods / R. Wiesendanger, H.-J. Güntherodt (eds.).
- Text
- Berlin ; New York : Springer, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text QH212.S35 S267 1996 Off-site Not available - Please for assistance.Micromachining and imaging : 13 February 1997, San Jose, California / Terry A. Michalske, Mark A. Wendman, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, DARPA--Defense Advanced Research Projects Agency.
- Text
- Bellingham, Wash., USA : SPIE, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TJ1191.5 .M53 1997g Off-site Not available - Please for assistance.Scanning probe microscopy : analytical methods / Roland Wiesendanger (ed.)
- Text
- Berlin ; New York : Springer-Verlag, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 S377 1998 Off-site Not available - Please for assistance.Scanning probe microscopy of polymers / Buddy D. Ratner, editor, Vladimir V. Tsukruk, editor.
- Text
- Washington, DC : American Chemical Society, 1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text QD381.9.S97 S23 1998 Off-site Not available - Please for assistance.Bringing scanning probe microscopy up to speed / by S.C. Minne, S.R. Manalis, C.F. Quate.
- Text
- Boston : Kluwer, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 M56 1999 Off-site Not available - Please for assistance.Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California / Eiichi Tamiya, Shuming Nie, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society.
- Text
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text R856.A2 P76 1999g Off-site Not available - Please for assistance.Scanning and force microscopies for biomedical applications II : 23-24 January 2000, San Jose, California / Shuming Nie, Eiichi Tamiya, Edward S. Yeung, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society.
- Text
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text R856.A2 S32 2000g Off-site Not available - Please for assistance.Advances in scanning probe microscopy / T. Sakurai, Y. Watanabe (eds.).
- Text
- Berlin ; New York : Springer, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 A38 2000 Off-site Not available - Please for assistance.Scanning probe microscopes : applications in science and technology / K.S. Birdi.
- Text
- Boca Raton, Fla. : CRC Press, [2003], ©2003.
- 2003-2003
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 B57 2003 Off-site Not available - Please for assistance.Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-6, 2002, Boston, Massachusetts / editors, Javier Piqueras [and others].
- Text
- Warrendale, Pa. : Materials Research Society, [2003], ©2003.
- 2003-2003
- 1 Item
Item details Format Call Number Item Location Text T174.7 .S967 2002g Off-site Not available - Please for assistance.Scanning tunneling microscopy/spectroscopy and related techniques : 12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003 / editors, P.M. Koenraad, M. Kemerink ; sponsoring organizations, Eindhoven University of Technology (TU/e) [and others].
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text QH212.S35 I585 2003g Off-site Not available - Please for assistance.Applications of scanned probe microscopy to polymers / James D. Batteas, editor, Chris A. Michaels, editor, Gilbert C. Walker, editor ; sponsored by the ACS Division of Polymeric Chemistry, Science and Engineering, Inc.
- Text
- Washington, DC : American Chemical Society : Distributed by Oxford University Press, [2005], ©2005.
- 2005-2005
- 1 Item
Item details Format Call Number Item Location Text QD381.9.O66 A64 2005 Off-site Not available - Please for assistance.Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.
- Text
- New York : Springer Science+Business, [2006], ©2006.
- 2006-2006
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 F68 2006g Off-site Not available - Please for assistance.Roadmap of scanning probe microscopy / S. Morita (ed.).
- Text
- Berlin : Springer, [2007], ©2007.
- 2007-2007
- 1 Item
Item details Format Call Number Item Location Text QH212.S35 R63 2007g Off-site Not available - Please for assistance.I. Electron transfer reactions in binuclear model systems ; II. Scanning probe microscopy studies of transition metal dichalcogenides materials : atomic to nanometer scale properties and surface modifications / by Yun Kim.
- Text
- 1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text Thesis Off-site Not available - Please for assistance.Scanning probe microscopy : beyond the images : École d'Oléron, 4-8 octobre 1991 / edited by C. Joachim, S. Gauthier.
- Text
- Les Ulis, France : Editions de Physique, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 E26 1991 Off-site Not available - Please for assistance.Mechanical and tribological studies at the nanometer scale / a thesis presented by Paul Edward Sheehan.
- Text
- 1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text THESIS Off-site Not available - Please for assistance.Chemical force microscopy / a thesis presented by Aleksandr Noy.
- Text
- 1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text THESIS Off-site Not available - Please for assistance.Carbon nanotube tips as nanometer scale probes for chemistry and biology / a thesis presented by Stanislaus Sherwood Wong.
- Text
- 1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text THESIS Off-site Not available - Please for assistance.Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces / edited by W.J. Lorenz and W. Plieth.
- Text
- Weinheim ; New York : Wiley-VCH, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text T174.7 .E43 1998 Off-site Not available - Please for assistance.Carbon nanotubes as molecular probes for scanning probe microscopy / a thesis presented by Chin Li Cheung.
- Text
- 2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text THESIS Off-site Not available - Please for assistance.Scanning probe microscopy : the lab on a tip / Ernst Meyer, Hans Josef Hug, Roland Bennewitz.
- Text
- Berlin ; New York : Springer, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 M49 2004 Off-site Not available - Please for assistance.Scanning probe microscopies beyond imaging : manipulation of molecules and nanostructures / edited by Paolo Samori.
- Text
- Weinheim : Wiley-VCH, c2006.
- 2006
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 S3 2006 Off-site Not available - Please for assistance.Instrumental community : probe microscopy and the path to nanotechnology / Cyrus C.M. Mody.
- Text
- Cambridge, Mass. : MIT Press, c2011.
- 2011
- 1 Item
Item details Format Call Number Item Location Text T174.7 .M63 2011 Off-site Not available - Please for assistance.Near-field optics : 9-10 July 1995, San Diego, California / Michael A. Paesler, Patrick J. Moyer, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 N427 1995 Off-site Not available - Please for assistance.Micromachining and imaging : 13 February, 1997, San Jose, California / Terry A. Michalske, Mark A. Wendman, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering ; cooperating organization DARPA--Defense Advanced Research Projects Agency.
- Text
- Bellingham, Wash. : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505.P762 vol.3009 Off-site Not available - Please for assistance.Scanning tunneling microscopy/spectroscopy and related techniques : 12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003 : [proceedings] / editors, P.M. Koenraad, M. Kemerink ; sponsoring organizations, Eindhoven University of Technology (TU/e), COBRA Inter-University Research Institute on Communication Technology, Nederlandse Organisatie voor Wetenschappelijk Onderzoek (NWO), Stichting voor Fundamenteel Onderzoek der Materie (FOM).
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text QH212.S35 I58 2003 Off-site Not available - Please for assistance.Scanning probe microscopies beyond imaging : manipulation of molecules and nanostructures / edited by Paolo Samorì.
- Text
- Weinheim : Wiley-VCH, 2006.
- 2006
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 S326 2006 Off-site Not available - Please for assistance.Nanoscale processes on insulating surfaces / Enrico Gnecco, Marek Szymonski.
- Text
- Singapore ; Hackensack, NJ : World Scientific, c2009.
- 2009
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 G64 2009 Off-site Not available - Please for assistance.Near field optics / edited by Dieter W. Pohl and Daniel Courjon.
- Text
- Dordrecht ; Boston : Kluwer Academic, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 N37 1992 Off-site Not available - Please for assistance.Near-field optics : 9-10 July 1995, San Diego, California / Michael A. Paesler, Patrick J. Moyer, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text QH212.S33 N427 1995 Off-site Not available - Please for assistance.Micromachining and imaging : 13 February, 1997, San Jose, California / Terry A. Michalske, Mark A. Wendman, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering ; cooperating organization DARPA--Defense Advanced Research Projects Agency.
- Text
- Bellingham, Wash. : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.3009 Off-site Not available - Please for assistance.
No results found from Digital Research Books Beta
Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.
