Research Catalog

  • Report on available standard samples and related materials for spectrochemical analysis, 1960 / compiled by Robert E. Michaelis for ASTM Committee E-2 on Emission Spectroscopy.

    • Text
    • Philadelphia : American Society for Testing Materials, c1961.
    • 1961
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 58-C) no. 58 (C-E)Offsite
  • Symposium on Extension of Sensitivity for Determining Various Constituents in Metals; [papers] presented at the sixty-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 28, 1961.

    • Text
    • Philadelphia, American Society for Testing and Materials [1962]
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 308)Offsite
  • Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

    • Text
    • Philadelphia, American Society for Testing and Materials [1964]
    • 1964
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 349)Offsite
  • X ray and optical emission analysis of high-temperature alloys; [papers]

    • Text
    • Philadelphia, American Society for Testing and Materials [1965]
    • 1965
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 376)Offsite
  • Atomic absorption spectroscopy; a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials, San Francisco, Calif., 23-28 June, 1968.

    • Text
    • Philadelphia, American Society for Testing and Materials [1969]
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 443)Offsite
  • Sampling, standards, and homogeneity : a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials, Los Angeles, Calif., 25-30 June, 1972 / W.R. Kennedy, symposium chairman. J.F. Woodruff, co-chairman.

    • Text
    • Philadelphia : American Society for Testing and Materials, [c1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing and Materials. Special technical publication, [no.] 540)Offsite
  • Optical emission spectrometers : a symposium presented at the Pittsburgh conference, Cleveland, Ohio, 8 March 1972 / sponsored by ASTM E-2 on Emission Spectroscopy ; W.R. Kennedy, symposium chairman.

    • Text
    • Philadelphia, Pa. : American Society for Testing and Materials, c1972.
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 517)Offsite
  • Atomic absorption spectroscopy ; a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials, San Francisco, Calif., 23-28 June, 1968.

    • Text
    • Philadelphia : American Society for Testing and Materials, [1969]
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text QC451 .S87 1968Off-site
  • Symposium on X-Ray and Electron Probe Analysis ; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

    • Text
    • Philadelphia : American Society for Testing and Materials, [1964]
    • 1964
    • 1 Item
    FormatCall NumberItem Location
    Text QD95 .Sy68 1964Off-site
  • Sampling, standards, and homogeneity ; a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials, Los Angeles, Calif., 25-30 June, 1972 / W. R. Kennedy, symposium chairman. J. F. Woodruff, co-chairman.

    • Text
    • Philadelphia : American Society for Testing and Materials, [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text QD130 .S9 1972Off-site
  • Methods for emission spectrochemical analysis : general practices, nomenclature, standard methods, proposed methods, suggested methods / sponsored by ASTM Committee E-2 on Emission Spectroscopy.

    • Text
    • Philadelphia, Pa. : ASTM, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.E46 M48 1982Off-site
  • Symposium on Extension of Sensitivity for Determining Various Constituents in Metals; [papers] presented at the sixty-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 28, 1961.

    • Text
    • Philadelphia, American Society for Testing and Materials [1962]
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text 8375.893Off-site

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